Diagnosing x-ray power and energy of tungsten wire array z-pinch with a flat spectral response x-ray diode

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A. E. Dangor ◽  
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AbstractExperiments of the return current post installed X-pinches were carried out on the 1-MA “QiangGuang-1” facility with the purpose of understanding X-pinch characteristics under this setup and establishing X-pinch backlighting diagnostics for the wire-array Z-pinches. Different wire-array loads along with the two-wire 30 µm Mo X-pinch backlighter were tested. The X-pinches emit the X-ray radiation with the burst time variation of ± 4 ns and the bright spot size of  ~30 µm. X-ray backlighting shadowgraphy images of the over-mass and radiation-suppressed Z-pinch wire array were obtained.


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