scholarly journals From nuclei to micro-structure in colloidal crystallization: Investigating intermediate length scales by small angle laser light scattering

2015 ◽  
Vol 143 (6) ◽  
pp. 064903 ◽  
Author(s):  
Richard Beyer ◽  
Markus Franke ◽  
Hans Joachim Schöpe ◽  
Eckhard Bartsch ◽  
Thomas Palberg
Keyword(s):  
Light Scattering ◽  
Small Angle ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Micro Structure ◽  
Length Scales ◽  
Colloidal Crystallization

Diffractometer for small-angle laser light scattering (SALLS) measurements

Polimery ◽  
1992 ◽  
Vol 37 (11/12) ◽  
pp. 520-522
Author(s):  
ZOFIA CZLONKOWSKA-KOHUTNICKA ◽  
TADEUSZ LIPOWIECKI ◽  
IRENA DANIEWSKA
Keyword(s):  
Light Scattering ◽  
Small Angle ◽  
Laser Light ◽  
Laser Light Scattering

scholarly journals Solution Properties of 1,3-Cyclohexadiene Polymers by Laser Light Scattering and Small-Angle Neutron Scattering

2006 ◽  
Vol 39 (2) ◽  
pp. 897-899 ◽  
Author(s):  
Seok I. Yun ◽  
Ken Terao ◽  
Kunlun Hong ◽  
Yuri B. Melnichenko ◽  
George D. Wignall ◽  
...  
Keyword(s):  
Light Scattering ◽  
Neutron Scattering ◽  
Small Angle ◽  
Small Angle Neutron Scattering ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Solution Properties

High-pressure cell for simultaneous small-angle x-ray scattering and laser light scattering measurements

2001 ◽  
Vol 72 (6) ◽  
pp. 2679-2685 ◽  
Author(s):  
Tadanori Koga ◽  
Shuiqin Zhou ◽  
Benjamin Chu ◽  
John L. Fulton ◽  
Shu Yang ◽  
...  
Keyword(s):  
High Pressure ◽  
Light Scattering ◽  
Small Angle ◽  
Laser Light ◽  
Laser Light Scattering ◽  
High Pressure Cell ◽  
X Ray ◽  
Pressure Cell ◽  
X Ray Scattering ◽  
Scattering Measurements

In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells

1993 ◽  
Vol 324 ◽  
Author(s):  
C. Pickering ◽  
D.A.O. Hope ◽  
W.Y. Leong ◽  
D.J. Robbins ◽  
R. Greef
Keyword(s):  
Growth Rate ◽  
Light Scattering ◽  
Laser Light ◽  
Growth Period ◽  
Laser Light Scattering ◽  
Heterojunction Bipolar Transistor ◽  
Dual Wavelength ◽  
Multi Quantum Well ◽  
Refractive Index Data

AbstractIn-situ dual-wavelength ellipsometry and laser light scattering have been used to monitor growth of Si/Si1−x,Gex heterojunction bipolar transistor and multi-quantum well (MQW) structures. The growth rate of B-doped Si0 8Ge0.2 has been shown to be linear, but that of As-doped Si is non-linear, decreasing with time. Refractive index data have been obtained at the growth temperature for x = 0.15, 0.20, 0.25. Interface regions ∼ 6-20Å thickness have been detected at hetero-interfaces and during interrupted alloy growth. Period-to-period repeatability of MQW structures has been shown to be ±lML.

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