Processing and crystallographic structure of non-equilibrium Si-doped HfO2

2015 ◽  
Vol 117 (24) ◽  
pp. 244103 ◽  
Author(s):  
Dong Hou ◽  
Chris M. Fancher ◽  
Lili Zhao ◽  
Giovanni Esteves ◽  
Jacob L. Jones
2019 ◽  
Vol 104 (8) ◽  
pp. 1197-1212 ◽  
Author(s):  
An-Ping Chen ◽  
Jian-Jun Yang ◽  
Da-Lai Zhong ◽  
Yong-Hong SHI ◽  
Jing-Bo Liu

AbstractEpidote spherulites are identified in a greenschist facies metavolcanic breccia enclosing a body of coesite-bearing eclogite at Ganghe in the Dabie ultrahigh-pressure metamorphic belt, east-central China. The epidote spherulites are formed by fibrous, radially arranged, and rare earth element (REE)-rich epidote crystals (ΣREE = 0.13–0.36 (or slightly higher) cations per formula unit, cpfu) and interfibrillar REE-poor epidote (ΣREE ≤ 0.10 cpfu). Some of the epidote spherulites are overgrown by radially arranged euhedral epidote crystals, which also form aggregates around preexisting quartz, plagioclase, and/or epidote. The epidote grains in such aggregates display oscillatory zoning, with REE content varying from a negligible amount to about 0.44 cpfu. Epidote also occurs as REE-poor individual euhedral crystals about the radial epidote aggregates or form loose clusters of randomly oriented crystals. Thermodynamic modeling of the mineral assemblages in the plagioclase pseudomorphs and in the matrix shows that they formed at greenschist facies metamorphic conditions (435–515 °C and 5–7 kbar). The epidote spherulites and radial euhedral epidote aggregates, however, do not belong to these assemblages and are non-equilibrium textures. They imply crystal growth under large degrees of supersaturation, with relatively low ratios of the diffusion rate (D) to the crystal growth rate (G). At low D/G ratios, spiky interfaces are favorable for diffusion-controlled growth and the resultant texture is a collection of spikes around a growth center, forming a spherulite. The change of epidote texture from spherulite to radial euhedral crystal aggregate implies a decrease of supersaturation and an increase of D/G, such that the crystal morphology was controlled by its crystallographic structure. The crystallization of the individual epidote grains corresponds to a further drop of supersaturation and a further increase of the D/G ratio, approaching to the equilibrium conditions. Transiently higher P-T conditions are inferred from the spherulite-forming reactions, relative to the P-T estimates for the equilibrium assemblages. The fibrous crystals in the spherulites having relatively large interfacial energies would inevitably adjust their shapes to equilibrium ones with low interfacial energies if the P-T-H2O conditions were maintained for a sufficiently long period of time. The non-equilibrium epidote aggregates likely formed in response to P-T and fluid pulses, possibly related to seismicity.


2021 ◽  
Vol 118 (20) ◽  
pp. 202105
Author(s):  
Sushrut Modak ◽  
Leonid Chernyak ◽  
Alfons Schulte ◽  
Minghan Xian ◽  
Fan Ren ◽  
...  

Author(s):  
L.J. Chen ◽  
Y.F. Hsieh

One measure of the maturity of a device technology is the ease and reliability of applying contact metallurgy. Compared to metal contact of silicon, the status of GaAs metallization is still at its primitive stage. With the advent of GaAs MESFET and integrated circuits, very stringent requirements were placed on their metal contacts. During the past few years, extensive researches have been conducted in the area of Au-Ge-Ni in order to lower contact resistances and improve uniformity. In this paper, we report the results of TEM study of interfacial reactions between Ni and GaAs as part of the attempt to understand the role of nickel in Au-Ge-Ni contact of GaAs.N-type, Si-doped, (001) oriented GaAs wafers, 15 mil in thickness, were grown by gradient-freeze method. Nickel thin films, 300Å in thickness, were e-gun deposited on GaAs wafers. The samples were then annealed in dry N2 in a 3-zone diffusion furnace at temperatures 200°C - 600°C for 5-180 minutes. Thin foils for TEM examinations were prepared by chemical polishing from the GaA.s side. TEM investigations were performed with JE0L- 100B and JE0L-200CX electron microscopes.


Author(s):  
D.T. Grubb

Diffraction studies in polymeric and other beam sensitive materials may bring to mind the many experiments where diffracted intensity has been used as a measure of the electron dose required to destroy fine structure in the TEM. But this paper is concerned with a range of cases where the diffraction pattern itself contains the important information.In the first case, electron diffraction from paraffins, degraded polyethylene and polyethylene single crystals, all the samples are highly ordered, and their crystallographic structure is well known. The diffraction patterns fade on irradiation and may also change considerably in a-spacing, increasing the unit cell volume on irradiation. The effect is large and continuous far C94H190 paraffin and for PE, while for shorter chains to C 28H58 the change is less, levelling off at high dose, Fig.l. It is also found that the change in a-spacing increases at higher dose rates and at higher irradiation temperatures.


Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.


Author(s):  
Robert M. Glaeser ◽  
Bing K. Jap

The dynamical scattering effect, which can be described as the failure of the first Born approximation, is perhaps the most important factor that has prevented the widespread use of electron diffraction intensities for crystallographic structure determination. It would seem to be quite certain that dynamical effects will also interfere with structure analysis based upon electron microscope image data, whenever the dynamical effect seriously perturbs the diffracted wave. While it is normally taken for granted that the dynamical effect must be taken into consideration in materials science applications of electron microscopy, very little attention has been given to this problem in the biological sciences.


Author(s):  
Edward A Kenik

Segregation of solute atoms to grain boundaries, dislocations, and other extended defects can occur under thermal equilibrium or non-equilibrium conditions, such as quenching, irradiation, or precipitation. Generally, equilibrium segregation is narrow (near monolayer coverage at planar defects), whereas non-equilibrium segregation exhibits profiles of larger spatial extent, associated with diffusion of point defects or solute atoms. Analytical electron microscopy provides tools both to measure the segregation and to characterize the defect at which the segregation occurs. This is especially true of instruments that can achieve fine (<2 nm width), high current probes and as such, provide high spatial resolution analysis and characterization capability. Analysis was performed in a Philips EM400T/FEG operated in the scanning transmission mode with a probe diameter of <2 nm (FWTM). The instrument is equipped with EDAX 9100/70 energy dispersive X-ray spectrometry (EDXS) and Gatan 666 parallel detection electron energy loss spectrometry (PEELS) systems. A double-tilt, liquid-nitrogen-cooled specimen holder was employed for microanalysis in order to minimize contamination under the focussed spot.


Author(s):  
T. Egami ◽  
H. D. Rosenfeld ◽  
S. Teslic

Relaxor ferroelectrics, such as Pb(Mg1/3Nb2/3)O3 (PMN) or (Pb·88La ·12)(Zr·65Ti·35)O3 (PLZT), show diffuse ferroelectric transition which depends upon frequency of the a.c. field. In spite of their wide use in various applications details of their atomic structure and the mechanism of relaxor ferroelectric transition are not sufficiently understood. While their crystallographic structure is cubic perovskite, ABO3, their thermal factors (apparent amplitude of thermal vibration) is quite large, suggesting local displacive disorder due to heterovalent ion mixing. Electron microscopy suggests nano-scale structural as well as chemical inhomogeneity.We have studied the atomic structure of these solids by pulsed neutron scattering using the atomic pair-distribution analysis. The measurements were made at the Intense Pulsed Neutron Source (IPNS) of Argonne National Laboratory. Pulsed neutrons are produced by a pulsed proton beam accelerated to 750 MeV hitting a uranium target at a rate of 30 Hz. Even after moderation by a liquid methane moderator high flux of epithermal neutrons with energies ranging up to few eV’s remain.


Author(s):  
Michel Le Bellac ◽  
Fabrice Mortessagne ◽  
G. George Batrouni

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