Potential drop strain measurement for creep monitoring

2015 ◽  
Author(s):  
Joseph Corcoran ◽  
Catrin M. Davies ◽  
Peter B. Nagy ◽  
Peter Cawley
Keyword(s):  
Strain Measurement ◽  
Potential Drop ◽  
Creep Monitoring

scholarly journals Creep strain measurement using a potential drop technique

2016 ◽  
Vol 110 ◽  
pp. 190-200 ◽  
Author(s):  
Joseph Corcoran ◽  
Paul Hooper ◽  
Catrin Davies ◽  
Peter B. Nagy ◽  
Peter Cawley
Keyword(s):  
Creep Strain ◽  
Strain Measurement ◽  
Potential Drop ◽  
Drop Technique

MATERIAL GAUGE FACTOR OF DIRECTIONAL ELECTRIC POTENTIAL DROP SENSORS FOR CREEP MONITORING

2011 ◽  
Author(s):  
E. Madhi ◽  
P. B. Nagy ◽  
Donald O. Thompson ◽  
Dale E. Chimenti
Keyword(s):  
Electric Potential ◽  
Potential Drop ◽  
Gauge Factor ◽  
Creep Monitoring

Potential Drop Strain Sensor for Creep Monitoring

2014 ◽  
Author(s):  
Joseph Corcoran ◽  
Catrin Davies ◽  
Peter Nagy ◽  
Peter Cawley
Keyword(s):  
High Temperature ◽  
Room Temperature ◽  
Potential Drop ◽  
Damage Mechanism ◽  
Strain Measurements ◽  
Monitoring Technique ◽  
Temperature Damage ◽  
Inspection Techniques ◽  
Creep Monitoring ◽  
Drop Technique

Creep is a high temperature damage mechanism of interest to the power industry and at present lacks a satisfactory monitoring technique. Existing material inspection techniques are extremely laborious while strain measurements rely on often infrequent off-load measurements. A quasi-DC directional potential drop technique is presented that is shown at both room temperature and at high temperature to act as a robust strain gauge. Resistivity changes that are expected to occur in high temperature environments are also discussed as a source of potential error in strain measurements.

IN-SITU CREEP MONITORING USING THE POTENTIAL DROP METHOD

2011 ◽  
Author(s):  
E. Madhi ◽  
G. Sposito ◽  
C. M. Davies ◽  
P. Cawley ◽  
P. B. Nagy ◽  
...  
Keyword(s):  
Potential Drop ◽  
Drop Method ◽  
Creep Monitoring

Strain measurement by means of bend contour microscopy

1989 ◽  
Vol 47 ◽  
pp. 210-211
Author(s):  
Philip D. Hren
Keyword(s):  
Strain Measurement ◽  
Large Angle ◽  
Single Crystal Silicon ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Silicon Membrane ◽  
Crystal Silicon ◽  
Contour Pattern ◽  
Convergent Beam ◽  
Low Symmetry

The pattern of bend contours which appear in the TEM image of a bent or curled sample indicates the shape into which the specimen is bent. Several authors have characterized the shape of their bent foils by this method, most recently I. Bolotov, as well as G. Möllenstedt and O. Rang in the early 1950’s. However, the samples they considered were viewed at orientations away from a zone axis, or at zone axes of low symmetry, so that dynamical interactions between the bend contours did not occur. Their calculations were thus based on purely geometric arguments. In this paper bend contours are used to measure deflections of a single-crystal silicon membrane at the (111) zone axis, where there are strong dynamical effects. Features in the bend contour pattern are identified and associated with a particular angle of bending of the membrane by reference to large-angle convergent-beam electron diffraction (LACBED) patterns.

Corrosion of Electronic and Magnetic Devices and Materials

1996 ◽  
Vol 451 ◽  
Author(s):  
Gerald S. Frankel
Keyword(s):  
Thin Film ◽  
Failure Modes ◽  
Galvanic Corrosion ◽  
Potential Drop ◽  
Magnetic Devices ◽  
Disk Structure ◽  
Magnetic Layers ◽  
Ohmic Potential Drop ◽  
Corrosion Problem ◽  
Corrosion Susceptibility

ABSTRACTCorrosion of thin film structures commonly used in electronic and magnetic devices is discussed. Typical failure modes are presented, and galvanic corrosion is discussed in some detail since it is one common problem with such devices. A graphical explanation for the determination of the ohmic potential drop during galvanic corrosion is presented. The corrosion problem of thin film disks is shown to have changed during the past ten years owing to changes in disk structure. The corrosion susceptibility of two antiferromagnetic alloys used for exchange coupling to soft magnetic layers is discussed.

SYNTHESIS OF ELEMENTS OF LOAD-BEARING SYSTEMS WITH A GIVEN LEVEL OF RELIABILITY

2020 ◽  
Author(s):  
Y.P. Manshin ◽  
◽  
E.Yu. Manshina ◽  
Keyword(s):  
Strain Measurement ◽  
Field Strain ◽  
Design Element ◽  
Load Bearing ◽  
Cyclic Bending ◽  
Bending Stresses

The article considers an algorithm for analyzing the results of field strain-measurement studies of machine structures, which allows obtaining data for the modernization of elements in the form of coefficients of parameter changes. As the object of application of the method, the design element of the header was selected, which had failures due to insufficient endurance under cyclic bending stresses.

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