Crack depth profiling using guided wave angle dependent reflectivity

2015 ◽  
Author(s):  
Arno Volker ◽  
Lotfollah Pahlavan ◽  
Gerrit Blacquiere
Keyword(s):  
Crack Depth ◽  
Depth Profiling ◽  
Guided Wave ◽  
Wave Angle ◽  
Angle Dependent Reflectivity

Arbitrary Crack Depth Profiling Through ACFM Data Using Type-2 Fuzzy Logic and PSO Algorithm

2019 ◽  
Vol 55 (2) ◽  
pp. 1-10
Author(s):  
Saeed M. Ahmadkhah ◽  
Reza P. R. Hasanzadeh ◽  
Mayorkinos Papaelias
Keyword(s):  
Fuzzy Logic ◽  
Crack Depth ◽  
Depth Profiling ◽  
Pso Algorithm

POTENTIAL DROP DATA INVERSION FOR CRACK DEPTH PROFILING

2008 ◽  
Author(s):  
G. Sposito ◽  
P. Cawley ◽  
P. B. Nagy ◽  
Donald O. Thompson ◽  
Dale E. Chimenti
Keyword(s):  
Crack Depth ◽  
Depth Profiling ◽  
Potential Drop ◽  
Data Inversion

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Atomic force microscopy (AFM) of the topography of silicon surfaces exposed to ion beams

1992 ◽  
Vol 50 (2) ◽  
pp. 1132-1133
Author(s):  
Mark Denker ◽  
Jennifer Wall ◽  
Mark Ray ◽  
Richard Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Incidence Angle ◽  
Ion Beam ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Ion Beams ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Trace Impurities ◽  
Energy Dose

Reactive ion beams such as O2+ and Cs+ are used in Secondary Ion Mass Spectrometry (SIMS) to analyze solids for trace impurities. Primary beam properties such as energy, dose, and incidence angle can be systematically varied to optimize depth resolution versus sensitivity tradeoffs for a given SIMS depth profiling application. However, it is generally observed that the sputtering process causes surface roughening, typically represented by nanometer-sized features such as cones, pits, pyramids, and ripples. A roughened surface will degrade the depth resolution of the SIMS data. The purpose of this study is to examine the relationship of the roughness of the surface to the primary ion beam energy, dose, and incidence angle. AFM offers the ability to quantitatively probe this surface roughness. For the initial investigations, the sample chosen was <100> silicon, and the ion beam was O2+.Work to date by other researchers typically employed Scanning Tunneling Microscopy (STM) to probe the surface topography.

A compact guided-wave EMAT with pulsed electromagnet for ferromagnetic tube inspection

2020 ◽  
Vol 64 (1-4) ◽  
pp. 951-958
Author(s):  
Tianhao Liu ◽  
Yu Jin ◽  
Cuixiang Pei ◽  
Jie Han ◽  
Zhenmao Chen
Keyword(s):  
Power Plants ◽  
Signal To Noise Ratio ◽  
Small Diameter ◽  
Performance Testing ◽  
Guided Wave ◽  
High Signal ◽  
Receiver Coil ◽  
Signal To Noise ◽  
Corrosion Defects

Small-diameter tubes that are widely used in petroleum industries and power plants experience corrosion during long-term services. In this paper, a compact inserted guided-wave EMAT with a pulsed electromagnet is proposed for small-diameter tube inspection. The proposed transducer is noncontact, compact with high signal-to-noise ratio and unattractive to ferromagnetic tubes. The proposed EMAT is designed with coils-only configuration, which consists of a pulsed electromagnet and a meander pulser/receiver coil. Both the numerical simulation and experimental results validate its feasibility on generating and receiving L(0,2) mode guided wave. The parameters for driving the proposed EMAT are optimized by performance testing. Finally, feasibility on quantification evaluation for corrosion defects was verified by experiments.

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