scholarly journals A sample holder with integrated laser optics for an ELMITEC photoemission electron microscope

2015 ◽  
Vol 86 (2) ◽  
pp. 023702 ◽  
Author(s):  
L. Gierster ◽  
L. Pape ◽  
A. A. Ünal ◽  
F. Kronast
Keyword(s):  
Electron Microscope ◽  
Sample Holder ◽  
Laser Optics ◽  
Photoemission Electron

Surface reactions observed by photoemission electron microscopy (PEEM)

1992 ◽  
Vol 50 (1) ◽  
pp. 286-287
Author(s):  
H.H. Rotermund
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Work Function ◽  
Chemical Reactions ◽  
Reaction Diffusion ◽  
Dynamic Processes ◽  
Clean Surface ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
Photoemission Electron

Chemical reactions at a surface will in most cases show a measurable influence on the work function of the clean surface. This change of the work function δφ can be used to image the local distributions of the investigated reaction,.if one of the reacting partners is adsorbed at the surface in form of islands of sufficient size (Δ>0.2μm). These can than be visualized via a photoemission electron microscope (PEEM). Changes of φ as low as 2 meV give already a change in the total intensity of a PEEM picture. To achieve reasonable contrast for an image several 10 meV of δφ are needed. Dynamic processes as surface diffusion of CO or O on single crystal surfaces as well as reaction / diffusion fronts have been observed in real time and space.

Imaging and measuring the electronic properties of epitaxial graphene with a photoemission electron microscope

2022 ◽  
Vol 131 (1) ◽  
pp. 015303
Author(s):  
F. Niefind ◽  
H. G. Bell ◽  
T. Mai ◽  
A. R. Hight Walker ◽  
R. E. Elmquist ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Electronic Properties ◽  
Epitaxial Graphene ◽  
Photoemission Electron

Development of Photoemission Electron Microscope by Imaging Inner Shell Photoelectrons Excited by High Energy Synchrotron Radiation X-rays

Hyomen Kagaku ◽  
2005 ◽  
Vol 26 (9) ◽  
pp. 524-531 ◽  
Author(s):  
Hideyuki YASUFUKU ◽  
Hideki YOSHIKAWA ◽  
Masahiro KIMURA ◽  
Sei FUKUSHIMA
Keyword(s):  
Electron Microscope ◽  
Synchrotron Radiation ◽  
High Energy ◽  
X Rays ◽  
Photoemission Electron

X-RAY PHOTOEMISSION ELECTRON MICROSCOPE DETERMINATION OF ORIGINS OF ROOM TEMPERATURE FERROMAGNETISM AND PHOTOLUMINESCENCE IN HIGH Co-CONTENT CoxZn1-xO FILMS

2014 ◽  
Vol 21 (04) ◽  
pp. 1450058 ◽  
Author(s):  
WEI CAO ◽  
VLADIMIR PANKRATOV ◽  
MARKO HUTTULA ◽  
LIANA SHIRMANE ◽  
YU RAN NIU ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Room Temperature ◽  
Room Temperature Ferromagnetism ◽  
Luminescence Properties ◽  
Edge Structure ◽  
X Ray ◽  
Zno Nanoclusters ◽  
X Ray Absorption ◽  
Photoemission Electron

In this paper, we reported on the X-ray photoemission electron microscope (XPEEM) determination of magnetic and luminescence origins for two Co x Zn 1-x O films. The cobalt fraction x of radio frequency co-sputtered samples were 0.86(2) and 0.92(2), respectively. Films were ferromagnetic and semiconductive. Unique narrow green color lines beside the ZnO intrinsic emissions were found with a decay time in microsecond range at room temperature. Origins of magnetic and luminescence properties were determined with XPEEM. The X-ray absorption near edge structure at the Co  L3-edge denoted that Co was partially oxidized, and phase-contrast images together with chemical composition identification further proved that Co and CoO co-existed in the samples. The ferromagnetism was attributed to ferromagnetism of Co clusters partially canceled by the antiferromagnetism of its oxide, and the photoluminescence to bound exciton in ZnO nanoclusters and defect related centers of ZnO nanoclusters in a Co -rich matrix. Present results show possibilities for adjusting magnetic and luminescence properties of Co – ZnO compounds by changing the cobalt concentration.

scholarly journals Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope

2018 ◽  
Vol 188 ◽  
pp. 77-84 ◽  
Author(s):  
A. Scholl ◽  
M.A. Marcus ◽  
A. Doran ◽  
J.R. Nasiatka ◽  
A.T. Young ◽  
...  
Keyword(s):  
Electron Microscope ◽  
X Ray ◽  
Photoemission Electron ◽  
Aberration Corrected

Microstructural observations with the photoemission electron microscope

Metallography ◽  
1972 ◽  
Vol 5 (4) ◽  
pp. 347-358
Author(s):  
C.D. Desforges ◽  
A. Fourdeux
Keyword(s):  
Electron Microscope ◽  
Photoemission Electron
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