Correlative analysis of conducting filament distribution at interfaces and bias-dependent noise sources in TiN/TiOx/Pt and Pt/TiOx/TiOy/Pt bipolar resistive switching frames

2015 ◽  
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pp. 033506 ◽  
Author(s):  
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Yoon Cheol Bae ◽  
Ah Rahm Lee ◽  
Kwang Ho Baek ◽  
Jin Pyo Hong
2014 ◽  
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pp. 083508 ◽  
Author(s):  
Joo Hyung Kim ◽  
Ah Rahm Lee ◽  
Yoon Cheol Bae ◽  
Kwang Ho Baek ◽  
Hyun Sik Im ◽  
...  

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Yinxiao Feng ◽  
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Vol 48 (6) ◽  
pp. 4057-4063 ◽  
Author(s):  
Oradee Srikimkaew ◽  
Sartanee Suebka ◽  
Panithan Sriborriboon ◽  
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2018 ◽  
Vol 18 (4) ◽  
pp. 2650-2656 ◽  
Author(s):  
Xuejiao Zhang ◽  
Zhiwei Xu ◽  
Bai Sun ◽  
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2014 ◽  
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pp. 355-358 ◽  
Author(s):  
Yoon Cheol Bae ◽  
Ah Rahm Lee ◽  
Gwang Ho Baek ◽  
Je Bock Chung ◽  
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Nanoscale ◽  
2017 ◽  
Vol 9 (40) ◽  
pp. 15314-15322 ◽  
Author(s):  
Se-I Oh ◽  
Janardhanan R. Rani ◽  
Sung-Min Hong ◽  
Jae-Hyung Jang

A solution-processed FeOx–GO hybrid based RRAM device with excellent self-rectifying characteristics (ILRS/IR > 104) is presented.


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