Correlative analysis of conducting filament distribution at interfaces and bias-dependent noise sources in TiN/TiOx/Pt and Pt/TiOx/TiOy/Pt bipolar resistive switching frames
2019 ◽
Vol 48
(6)
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pp. 4057-4063
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2018 ◽
Vol 57
(6)
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pp. 064202
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2018 ◽
Vol 18
(4)
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pp. 2650-2656
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2014 ◽
Vol 14
(3)
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pp. 355-358
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