Microstructure from joint analysis of experimental data andab initiointeractions: Hydrogenated amorphous silicon

2014 ◽  
Vol 116 (24) ◽  
pp. 244305 ◽  
Author(s):  
Parthapratim Biswas ◽  
D. A. Drabold ◽  
Raymond Atta-Fynn
Keyword(s):  
Experimental Data ◽  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Joint Analysis ◽  
Hydrogenated Amorphous

New Model for “Stretched Exponential” Relaxation

1996 ◽  
Vol 420 ◽  
Author(s):  
Chris G. Van De Walle
Keyword(s):  
Experimental Data ◽  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Statistical Distributions ◽  
New Model ◽  
Stretched Exponential ◽  
Careful Treatment ◽  
Exponential Relaxation ◽  
Hydrogenated Amorphous

AbstractA new model to explain stretched exponential relaxation in hydrogenated amorphous silicon is presented. The model does not invoke statistical distributions; rather, it is based on a careful treatment of diffusion, including retrapping. Excellent fits to a variety of experimental data are obtained.

Steady-State Photoconductivity in Undoped Amorphous Silicon

1989 ◽  
Vol 149 ◽  
Author(s):  
Jeffrey Zhaohuai Liu ◽  
S. Wagner
Keyword(s):  
Experimental Data ◽  
Activation Energy ◽  
Steady State ◽  
Amorphous Silicon ◽  
Thermal Activation ◽  
Hydrogenated Amorphous Silicon ◽  
Thermal Activation Energy ◽  
Strong Temperature Dependence ◽  
Quasi Fermi Level ◽  
Hydrogenated Amorphous

ABSTRACTAn analytical expression for the thermal activation energy of the steady-state photoconductivity is shown to agree with experimental data in a range of temperature and generation rate for undoped hydrogenated amorphous silicon (a-Si:H). This agreement supports our suggestion that the commonly observed small activation energy of the photoconductivity in undoped a-Si:H originates in the strong temperature dependence of the quasi-Fermi level for electrons.

BONDING IN HYDROGENATED AMORPHOUS SILICON

1981 ◽  
Vol 42 (C4) ◽  
pp. C4-773-C4-777 ◽  
Author(s):  
H. R. Shanks ◽  
F. R. Jeffrey ◽  
M. E. Lowry
Keyword(s):  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Hydrogenated Amorphous

High Rate Deposition of Stable Hydrogenated Amorphous Silicon in Transition from Amorphous to Microcrystalline Silicon

2003 ◽  
Vol 762 ◽  
Author(s):  
Guofu Hou ◽  
Xinhua Geng ◽  
Xiaodan Zhang ◽  
Ying Zhao ◽  
Junming Xue ◽  
...  
Keyword(s):  
Phase Transition ◽  
Amorphous Silicon ◽  
Hydrogenated Amorphous Silicon ◽  
Chemical Vapor ◽  
High Rate ◽  
Very High Frequency ◽  
High Quality ◽  
Working Pressure ◽  
Hydrogen Dilution ◽  
Hydrogenated Amorphous

AbstractHigh rate deposition of high quality and stable hydrogenated amorphous silicon (a-Si:H) films were performed near the threshold of amorphous to microcrystalline phase transition using a very high frequency plasma enhanced chemical vapor deposition (VHF-PECVD) method. The effect of hydrogen dilution on optic-electronic and structural properties of these films was investigated by Fourier-transform infrared (FTIR) spectroscopy, Raman scattering and constant photocurrent method (CPM). Experiment showed that although the phase transition was much influenced by hydrogen dilution, it also strongly depended on substrate temperature, working pressure and plasma power. With optimized condition high quality and high stable a-Si:H films, which exhibit σph/σd of 4.4×106 and deposition rate of 28.8Å/s, have been obtained.

Sign in / Sign up

Export Citation Format

Share Document