Note: Calibration of atomic force microscope cantilevers using only their resonant frequency and quality factor

2014 ◽  
Vol 85 (11) ◽  
pp. 116101 ◽  
Author(s):  
John E. Sader ◽  
James R. Friend
Keyword(s):  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Quality Factor ◽  
Atomic Force

Theoretical Approach to Contrast Mechanism for U-AFM

2002 ◽  
Author(s):  
C. Miyasaka ◽  
B. R. Tittmann ◽  
T. Adachi ◽  
A. Yamaji
Keyword(s):  
Theoretical Analysis ◽  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Dynamic Theory ◽  
Beam Theory ◽  
Ultrasonic Waves ◽  
Two Dimensional ◽  
Atomic Force ◽  
Afm Imaging ◽  
Contrast Mechanism

When the Ultrasonic-Atomic Force Microscope (U-AFM) is used to form an image of a surface of a specimen having discontinuities, contrast of the specimen in the image is usually stronger than that of an image formed by a conventional Atomic Force Microscope (AFM). In this article, the mechanism of the contrast of the image obtained by the U-AFM was explained by theoretical analysis. A ceramic and metal jointed bar (Steel/Cu/Si3N4) was selected as a specimen for this study. The specimen was located on the surface of a disc transducer generating ultrasonic waves up to 500 KHz, and was vibrated, wherein its first resonant frequency was 133.43 kHz. Both stress and displacement of the specimen were analyzed by classical beam theory and the two-dimensional elasto-dynamic theory. Experimental U-AFM imaging analyses were also carried out to compare the results.

The Influence of the Resonant Frequency of a Tube-Type Piezo Actuator on Atomic Force Microscope Anodization Lithography

2007 ◽  
Vol 51 (5) ◽  
pp. 1782-1786 ◽  
Author(s):  
Sukjong Bae ◽  
Cheol Hong Park ◽  
Cheolsu Han ◽  
Chung Choo Chung ◽  
Gwangmin Kwon ◽  
...  
Keyword(s):  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Piezo Actuator ◽  
Atomic Force ◽  
Tube Type

scholarly journals See Atoms in Motion!

1996 ◽  
Vol 4 (1) ◽  
pp. 3-4
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Ultrahigh Vacuum ◽  
Atomic Motion ◽  
Atomic Resolution ◽  
Atomic Force ◽  
Silicon Cantilever ◽  
Mechanical Resonant Frequency ◽  
Reconstructed Surface ◽  
Stiff Spring

It is impressive enough that individual atoms can be resolved with the atomic force microscope (AFM), but who would have thought that atomic motion would be detected so soon? Atomic resolution with the AFM was only recently achieved. As reported in this column, Franz Giessibl was able to demonstrate local resolution of adatoms of the Si(111) 7×7 reconstructed surface. Now, Yasuhiro Sugawara. Masahiro Ohta, Hitoshi Ueyama, and Seizo Morita of Hiroshima University have demonstrated atomic resolution of the surface of InP(110). Not only that, but images taken about one minute apart show that some of the atoms had moved! Sugawara et al, used a very compact AFM under ultrahigh vacuum (4 X 10-8 Pa) to accomplish this impressive feat. A stiff (spring constant of 34 N/m) silicon cantilever was used. This stiffness, along with a mechanical resonant frequency of 151 kHz, was used to keep the cantilever from jumping onto the sample and crushing the initially sharp tip.

scholarly journals Temperature-Dependent Viscosity of Organic Materials Characterized by Atomic Force Microscope

Atmosphere ◽  
2021 ◽  
Vol 12 (11) ◽  
pp. 1476
Author(s):  
Yiming Qin ◽  
Jianhuai Ye ◽  
Paul Ohno ◽  
Theodora Nah ◽  
Scot T. Martin
Keyword(s):  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Organic Materials ◽  
Dioctyl Phthalate ◽  
Cloud Formation ◽  
Temperature Dependent ◽  
Temperature Dependent Viscosity ◽  
Atomic Force ◽  
Dependent Viscosity ◽  
Atmospherically Relevant

The viscosity of atmospheric aerosol particles determines the equilibrium timescale at which a molecule diffuses into and out of particles, influencing processes such as gas–particle partitioning, light scattering, and cloud formation that can affect air quality and climate. This particle viscosity is sensitive to environmental conditions such as relative humidity and temperature. Current experimental techniques mainly characterize aerosol viscosity at room temperature. The influence of temperature on the viscosity of organic aerosol remains underexplored. Herein, the viscosity of atmospherically relevant organic materials was examined at a range of temperatures from 15 °C to 95 °C using an atomic force microscope (AFM) equipped with a temperature-controlled sample module. Dioctyl phthalate and sucrose were selected for investigation. Dioctyl phthalate served as the proxy for atmospherically relevant primary organic materials while sucrose served as the proxy for secondary organic materials. The resonant frequency responses of the AFM cantilever within dioctyl phthalate and sucrose were recorded. The link between the resonant frequency and material viscosity was established via a hydrodynamic function. Results obtained from this study were consistent with previously reported viscosities, thus demonstrating the critical capability of AFM in temperature-dependent viscosity measurements.

scholarly journals Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

Sensors ◽  
2020 ◽  
Vol 20 (17) ◽  
pp. 4784 ◽  
Author(s):  
Bernard Ouma Alunda ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Atomic Force Microscope ◽  
Chemical Sensors ◽  
High Speed ◽  
Molecular Sensing ◽  
Force Microscopy ◽  
Detection Systems ◽  
Atomic Force ◽  
Mechanical Spring

This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.

Sign in / Sign up

Export Citation Format

Share Document