Probing the limits of Si:P δ-doped devices patterned by a scanning tunneling microscope in a field-emission mode

2014 ◽  
Vol 105 (16) ◽  
pp. 163110 ◽  
Author(s):  
M. Rudolph ◽  
S. M. Carr ◽  
G. Subramania ◽  
G. Ten Eyck ◽  
J. Dominguez ◽  
...  
Keyword(s):  
Field Emission ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Emission Mode

Field emission interferometry with the scanning tunneling microscope

1999 ◽  
Vol 426 (1) ◽  
pp. L420-L425 ◽  
Author(s):  
A.J. Caamaño ◽  
Y. Pogorelov ◽  
O. Custance ◽  
J. Méndez ◽  
A.M. Baró ◽  
...  
Keyword(s):  
Field Emission ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope
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