scholarly journals Nanothermal characterization of amorphous and crystalline phases in chalcogenide thin films with scanning thermal microscopy

2014 ◽  
Vol 116 (13) ◽  
pp. 134904 ◽  
Author(s):  
J. L. Bosse ◽  
M. Timofeeva ◽  
P. D. Tovee ◽  
B. J. Robinson ◽  
B. D. Huey ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Thermal Microscopy ◽  
Crystalline Phases ◽  
Thermal Microscopy ◽  
Chalcogenide Thin Films

Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy

2013 ◽  
Vol 44 (11) ◽  
pp. 1029-1034 ◽  
Author(s):  
Séverine Gomès ◽  
Pascal Newby ◽  
Bruno Canut ◽  
Konstantinos Termentzidis ◽  
Olivier Marty ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

scholarly journals Advances in Scanning Thermal Microscopy Measurements for Thin Films

2019 ◽  
Author(s):  
Liliana Vera-Londono ◽  
Olga Caballero-Calero ◽  
Jaime Andrés Pérez-Taborda ◽  
Marisol Martín-González
Keyword(s):  
Thin Films ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

Selective wet-etching and characterization of chalcogenide thin films in inorganic alkaline solutions

2007 ◽  
Vol 353 (13-15) ◽  
pp. 1441-1445 ◽  
Author(s):  
J. Orava ◽  
T. Wagner ◽  
M. Krbal ◽  
T. Kohoutek ◽  
Mil. Vlcek ◽  
...  
Keyword(s):  
Thin Films ◽  
Wet Etching ◽  
Alkaline Solutions ◽  
Chalcogenide Thin Films

scholarly journals Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy

2017 ◽  
Vol 28 (48) ◽  
pp. 485706 ◽  
Author(s):  
Yunfei Ge ◽  
Yuan Zhang ◽  
Jonathan M R Weaver ◽  
Phillip S Dobson
Keyword(s):  
Thin Films ◽  
Thermal Transport ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy

Preparation and characterization of laser-ablated multicomponent chalcogenide thin films

1990 ◽  
Vol 5 (3) ◽  
pp. 511-514 ◽  
Author(s):  
Didarul Islam ◽  
C. E. Brient ◽  
R. L. Cappelletti
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Thermal Evaporation ◽  
Analytical Techniques ◽  
X Rays ◽  
Single Source ◽  
X Ray ◽  
Chalcogenide Thin Films ◽  
Scanning Electron

The preparation of multicomponent chalcogenide glassy thin films from bulk targets by laser ablation is described. The film stoichiometries are characterized by proton-induced x-ray emission (PIXE). Compared to single source thermal evaporation, laser ablation is found to preserve starting stoichiometries in the resulting thin films far more accurately. Thermally evaporated films were studied both by PIXE and by energy dispersed x rays (EDX) produced in a scanning electron microscope, and the results of these two analytical techniques compare well.

Characterization of adhesive penetration in wood bond by means of scanning thermal microscopy (SThM)

Holzforschung ◽  
2016 ◽  
Vol 70 (4) ◽  
pp. 323-330 ◽  
Author(s):  
Deliang Xu ◽  
Yang Zhang ◽  
Handong Zhou ◽  
Yujie Meng ◽  
Siqun Wang
Keyword(s):  
Direct Contact ◽  
Phenol Formaldehyde ◽  
Transitional Zone ◽  
Transitional Region ◽  
Scanning Thermal Microscopy ◽  
Scale Level ◽  
Thermal Microscopy ◽  
Micro Scale ◽  
Adhesive Penetration

Abstract The penetration characteristics of phenol formaldehyde (PF) resin, modified by two different nanomaterials (PFmod), has been studied by means of scanning thermal microscopy (SThM). The thermal conductivity (ThC) of the two PFmod was lower than that of the cell wall (CW), but the ThC of both PF resins was basically the same. SThM imaging revealed the penetration of parts of PFmod into the CW by a ThC transitional region, which exists between the CW and the resin. In the transitional zone, the ThC changed obviously in a region about 2 μm in width. This region includes two subregions, one about 0.7 μm and another 1.3 μm in width. The first one is the interface, where PFmod and the CW are in direct contact where the ThC changes rapidly. In the second subregion, the PFmod and CW are in interaction, and ThC changes slowly. Regarding the adhesives’ penetration into the cell lumen, the ThC of the penetrating adhesive was higher than that in the glue line, and this is an indication that SThM is a useful tool to detect the differences of adhesive penetration at the micro-scale level.

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