Magnetic properties and interlayer coupling of epitaxial Co/Cu films on Si

2014 ◽  
Vol 116 (6) ◽  
pp. 063906 ◽  
Author(s):  
R. Mansell ◽  
D. C. M. C. Petit ◽  
A. Fernández-Pacheco ◽  
R. Lavrijsen ◽  
J. H. Lee ◽  
...  
1995 ◽  
Vol 148 (1-2) ◽  
pp. 90-92 ◽  
Author(s):  
H.P. Oepen ◽  
S. Knappmann ◽  
W. Wulfhekel
Keyword(s):  

2017 ◽  
Vol 73 (1) ◽  
pp. 85-90 ◽  
Author(s):  
Ali Karpuz ◽  
Salih Colmekci ◽  
Hakan Kockar ◽  
Hilal Kuru ◽  
Mehmet Uckun

AbstractThe structural and corresponding magnetic properties of Ni/Cu films sputtered at low and high deposition rates were investigated as there is a limited number of related studies in this field. 5[Ni(10 nm)/Cu(30 nm)] multilayer thin films were deposited using two DC sputtering sources at low (0.02 nm/s) and high (0.10 nm/s) deposition rates of Ni layers. A face centered cubic phase was detected for both films. The surface of the film sputtered at the low deposition rate has a lot of micro-grains distributed uniformly and with sizes from 0.1 to 0.4 μm. Also, it has a vertical acicular morphology. At high deposition rate, the number of micro-grains considerably decreased, and some of their sizes increased up to 1 μm. The surface of the Ni/Cu multilayer deposited at the low rate has a relatively more grainy and rugged structure, whereas the surface of the film deposited at the high rate has a relatively larger lateral size of surface grains with a relatively fine morphology. Saturation magnetisation, Ms, values were 90 and 138 emu/cm3 for deposition rates of 0.02 and 0.10 nm/s, respectively. Remanence, Mr, values were also found to be 48 and 71 emu/cm3 for the low and high deposition rates, respectively. The coercivity, Hc, values were 46 and 65 Oe for the low and high Ni deposition rates, respectively. The changes in the film surfaces provoked the changes in the Hc values. The Ms, Mr, and Hc values of the 5[Ni(10 nm)/Cu(30 nm)] films can be adjusted considering the surface morphologies and film contents caused by the different Ni deposition rates.


2002 ◽  
Vol 241 (2-3) ◽  
pp. 157-161 ◽  
Author(s):  
Xiaofang Bi ◽  
Shengkai Gong ◽  
Huibin Xu ◽  
K. Ishiyama ◽  
Ken-ichi Arai
Keyword(s):  

1992 ◽  
Vol 46 (2) ◽  
pp. 1244-1247 ◽  
Author(s):  
Ravi P. Singh ◽  
Z. C. Tao ◽  
M. Singh

2012 ◽  
Vol 476-478 ◽  
pp. 2415-2418
Author(s):  
Qi Ping Zhang ◽  
Qing Qing Fang ◽  
Wei Na Wang ◽  
Qing Rong Lv ◽  
Yan Mei Liu ◽  
...  

In this paper, we investigated the structure of SmCo films with different thickness and the effects of Cr buffer layer on the structure and morphology of SmCo/Cu thin films. Our data revealed that the magnetic properties of the samples were enhanced by the crystallization of SmCo which was promoted by the optimized Cu underlayers. We also found that the surface roughness can be decreased by Cr layer and the texture can be improved by prolonging the annealing time for thick SmCo film. Thus, we concluded that the magnetic properties of SmCo/Cu films can be further optimized by varying the thickness of Cr buffer layers.


1992 ◽  
Vol 111 (1-2) ◽  
pp. 123-129 ◽  
Author(s):  
Yi-hua Liu ◽  
Xiao-ding Ma ◽  
Jian-sheng Lan ◽  
Hao Wang
Keyword(s):  

2015 ◽  
Vol 162 ◽  
pp. 222-228 ◽  
Author(s):  
Agnieszka Franczak ◽  
Alexandra Levesque ◽  
Piotr Zabinski ◽  
Donggang Li ◽  
Maciej Czapkiewicz ◽  
...  

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