scholarly journals Time-resolved measurements of the hot-electron population in ignition-scale experiments on the National Ignition Facility (invited)

2014 ◽  
Vol 85 (11) ◽  
pp. 11D501 ◽  
Author(s):  
M. Hohenberger ◽  
F. Albert ◽  
N. E. Palmer ◽  
J. J. Lee ◽  
T. Döppner ◽  
...  
Keyword(s):  
Hot Electron ◽  
National Ignition Facility ◽  
Time Resolved ◽  
Electron Population ◽  
Time Resolved Measurements

scholarly journals The magnetic recoil spectrometer (MRSt) for time-resolved measurements of the neutron spectrum at the National Ignition Facility (NIF)

2016 ◽  
Vol 87 (11) ◽  
pp. 11D806 ◽  
Author(s):  
J. A. Frenje ◽  
T. J. Hilsabeck ◽  
C. W. Wink ◽  
P. Bell ◽  
R. Bionta ◽  
...  
Keyword(s):  
Neutron Spectrum ◽  
National Ignition Facility ◽  
Time Resolved ◽  
Time Resolved Measurements

scholarly journals Measuring the hot-electron population using time-resolved hard x-ray detectors on the NIF

2013 ◽  
Author(s):  
M. Hohenberger ◽  
N. E. Palmer ◽  
G. LaCaille ◽  
E. L. Dewald ◽  
L. Divol ◽  
...  
Keyword(s):  
Hot Electron ◽  
Time Resolved ◽  
Electron Population ◽  
X Ray

Prospects of Time-Resolved Photon Emission as a Debug Tool

2002 ◽  
Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi
Keyword(s):  
Photon Emission ◽  
Photon Counting ◽  
Signal Propagation ◽  
General Function ◽  
Hot Electron ◽  
Detector Performance ◽  
Time Resolved ◽  
Switching Event ◽  
Emission System

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.

scholarly journals Time-resolved ARPES Determination of a Quasi-Particle Band Gap and Hot Electron Dynamics in Monolayer MoS2

Nano Letters ◽  
2021 ◽  
Vol 21 (17) ◽  
pp. 7363-7370
Author(s):  
Woojoo Lee ◽  
Yi Lin ◽  
Li-Syuan Lu ◽  
Wei-Chen Chueh ◽  
Mengke Liu ◽  
...  
Keyword(s):  
Band Gap ◽  
Hot Electron ◽  
Electron Dynamics ◽  
Monolayer Mos2 ◽  
Quasi Particle ◽  
Time Resolved

Time-resolved measurements of sodium emission in the plume generated by laser ablation of myocardium tissue

2004 ◽  
Author(s):  
Hanriete P. de Souza ◽  
Egberto Munin ◽  
Carlos Eduardo de Vilhena Paiva ◽  
Leandro P. Alves ◽  
Marcela L. Redigolo ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Time Resolved ◽  
Time Resolved Measurements
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