A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering
2002 ◽
Vol 315
(1-2)
◽
pp. 45-52
2014 ◽
Vol 404
◽
pp. 359-367
◽
2012 ◽
Vol 121
(2B)
◽
pp. B-110-B-120
◽
2004 ◽
Vol 88
(1-3)
◽
pp. 173-189
◽
2017 ◽
Vol 12
(9)
◽
pp. 2115-2130
◽