scholarly journals Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach

AIP Advances ◽  
2014 ◽  
Vol 4 (5) ◽  
pp. 057130 ◽  
Author(s):  
Yuliang Wang ◽  
Huimin Wang ◽  
Shusheng Bi
Keyword(s):  
Atomic Force Microscope ◽  
Real Time ◽  
Colloidal Probe ◽  
Visual Sensing ◽  
Atomic Force ◽  
Time Drift

Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurements

2011 ◽  
Vol 22 (9) ◽  
pp. 094017
Author(s):  
Xiaomei Chen ◽  
Ludger Koenders ◽  
Helmut Wolff ◽  
Holger Neddermeyer ◽  
Frank Haertig
Keyword(s):  
Atomic Force Microscope ◽  
Real Time ◽  
Atomic Force ◽  
Displacement Measurements

Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing

2012 ◽  
Vol 135 (1) ◽  
Author(s):  
Fakhreddine Landolsi ◽  
Fathi H. Ghorbel ◽  
James B. Dabney
Keyword(s):  
Numerical Simulations ◽  
Atomic Force Microscope ◽  
Contact Mechanics ◽  
Interaction Model ◽  
Research Interest ◽  
Visual Sensing ◽  
Atomic Force ◽  
Proposed Model ◽  
Theoretical Investigations ◽  
Afm Cantilever

The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.

Imaging real-time neurite outgrowth and cytoskeletal reorganization with an atomic force microscope

1995 ◽  
Vol 269 (1) ◽  
pp. C275-C285 ◽  
Author(s):  
R. Lal ◽  
B. Drake ◽  
D. Blumberg ◽  
D. R. Saner ◽  
P. K. Hansma ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Real Time ◽  
Growth Cones ◽  
Cytoskeletal Reorganization ◽  
Network Cell ◽  
Pc 12 Cells ◽  
3T3 Fibroblasts ◽  
Atomic Force ◽  
Nih 3T3 ◽  
Cell Thickness

An atomic force microscope was used to image the morphology and structural reorganization of rat NIH/3T3 fibroblasts and PC-12 cells growing in petri dishes. NIH/3T3 fibroblasts had a uniform morphology and an extensive cytoskeletal network. Cell thickness varied from approximately 2-3 microns above the nucleus to approximately 20-30 nm over the distal processes, and cytoskeletal fibers as small as 30 nm wide were observed. Imaging over an extended period of time showed a limited degree of cytoskeletal reorganization. Localized force dissection did not induce significant retraction of cellular processes and immediate cell death. Differentiating PC-12 cells with a neuronal phenotype had a nonuniform morphology, abundant cytoskeletal elements, neuritic processes, and growth cones. The cell thickness varied from approximately 5-8 microns over the nucleus to approximately 100-500 nm over the neuritic processes; growth cones approximately 50-700 nm wide and end structures approximately 30-150 nm wide were visible. Repeated imaging showed reorganization of the growth cone, especially the appearance and disappearance of beadlike features and fibrous organization. Thus an atomic force microscope can be used for high-resolution real-time studies of the dynamic subcellular mechanisms that drive cell behavior.

Real-time State Estimation and Fault Detection for Controlling Atomic Force Microscope Based Nano Manipualtion

2008 ◽  
Vol 41 (2) ◽  
pp. 8263-8268
Author(s):  
Lianqing Liu ◽  
Ning Xi ◽  
Yilun Luo ◽  
Jiangbo Zhang ◽  
Guangyong Li ◽  
...  
Keyword(s):  
Fault Detection ◽  
Atomic Force Microscope ◽  
State Estimation ◽  
Real Time ◽  
Atomic Force

scholarly journals Direct force measurements between silica particles in aqueous solutions of ionic liquids containing 1-butyl-3-methylimidazolium (BMIM)

2015 ◽  
Vol 17 (25) ◽  
pp. 16553-16559 ◽  
Author(s):  
Valentina Valmacco ◽  
Gregor Trefalt ◽  
Plinio Maroni ◽  
Michal Borkovec
Keyword(s):  
Ionic Liquids ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Silica Particles ◽  
Force Measurements ◽  
Probe Technique ◽  
Colloidal Probe ◽  
Atomic Force

Direct force measurements between silica particles were carried out using the colloidal probe technique, which is based on an atomic force microscope (AFM).

scholarly journals Real-time, label-free monitoring of cell viability based on cell adhesion measurements with an atomic force microscope

2017 ◽  
Vol 15 (1) ◽  
Author(s):  
Fang Yang ◽  
René Riedel ◽  
Pablo del Pino ◽  
Beatriz Pelaz ◽  
Alaa Hassan Said ◽  
...  
Keyword(s):  
Cell Adhesion ◽  
Cell Viability ◽  
Atomic Force Microscope ◽  
Real Time ◽  
Label Free ◽  
Atomic Force

Atomic force microscope cantilever as an encoding sensor for real-time displacement measurement

2010 ◽  
Vol 21 (10) ◽  
pp. 105205 ◽  
Author(s):  
Xiaomei Chen ◽  
Ludger Koenders ◽  
Helmut Wolff ◽  
Frank Haertig ◽  
Meinhard Schilling
Keyword(s):  
Atomic Force Microscope ◽  
Real Time ◽  
Displacement Measurement ◽  
Atomic Force Microscope Cantilever ◽  
Atomic Force ◽  
Force Microscope Cantilever
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