Refractive index engineering of metal-dielectric nanocomposite thin films for optical super absorber

2014 ◽  
Vol 104 (20) ◽  
pp. 203112 ◽  
Author(s):  
Nan Zhang ◽  
Kai Liu ◽  
Haomin Song ◽  
Zhejun Liu ◽  
Dengxin Ji ◽  
...  
2009 ◽  
Vol 74 ◽  
pp. 269-272 ◽  
Author(s):  
Pijus Kundu ◽  
A. Ray Chaudhuri ◽  
S. Das ◽  
T.K. Bhattacharyya

In this paper, the etching characteristic of diamond like nanocomposite thin films materials in hydrazine has been reported. The experiments have been carried out to explore the compatibility of hydrazine as a propellant with silicon based microthruster. In the reported work, 2″ N-type (100) silicon wafer with 4-6 Ω cm resistivity were used as base material. Diamond-like nanocomposite (DLN) films are deposited on silicon substrate by plasma enhanced chemical vapor deposition (PECVD) process using siloxane or silazane based precursors or their combinations. Thickness of deposited DLN thin films is around 1 µm. DLN samples are treated in 98% hydrazine at 25 °C, 70 °C and 90 °C for different time and etch rates and subsequently the change in refractive index of the DLN films if any has been measured.


Author(s):  
Ahmad Alsaad ◽  
Ahmad Ahmad ◽  
Abdul Raouf Al Dairy ◽  
Issam A. Qattan ◽  
Shatha Al Fawares ◽  
...  

We report the synthesis and characterization of Poly Methyl-Meth-Acrylate (PMMA)/Poly vinylalcohol (PVA) polymeric blend doped with different concentrations of Copper oxide (CuO) nanoparticles (NPs). The (PMMA-PVA)/CuO nanocomposite hybrid thin films (wt. % = 0%, 2%, 4%, 8%, and 16%) of CuO NPs are deposited on glass substrates via dip-coating technique. The transmittance (T%), reflectance (R%), the absorption coefficient (α), the optical constants [refractive index (n), extinction coefficient (k)], optical dielectric functions [ɛ',ɛ''] are investigated and interpreted. Tauc, Urbach, Spitzer-Fan, and Drude models are employed to calculate the optical bandgap energy (Eg) and the optoelectronic parameters of the nanocomposite thin films. The refractive index and optical bandgap energy of of (PMMA-PVA) polymeric thin film are found to be (1.5 to 1.85) and 4.101 eV, respectively. Incorporation of specific concentrations of CuO-NPs in (PMMA-PVA) polymeric thin films leads to a noticeable decrease in the optical bandgap energy and to an increase of the refractive index. Moreover, Fourier Transform Infrared Spectroscopy (FTIR) transmittance spectra are measured and analyzed for undoped and doped polymeric thin films to pinpoint the major vibrational modes in the spectral range (500 and 4000 cm-1), as well as, the nature of network bonding in both systems. Thermal stability of thin films is investigated by performing thermogravimetric analysis (TGA). The TGA thermograms confirm that both doped polymeric thin films are thermally stable at temperatures below 110°C which enables them to be attractive for a wide range of optical and optoelectronic applications. Our results indicate that optical, vibrational and thermal properties of both polymeric thin films can be tuned for specific applications by the appropriate corporation of particular concentrations of CuO-NPs.


2019 ◽  
Vol 17 ◽  
pp. 34-42 ◽  
Author(s):  
Jemy James ◽  
Aparna Beena Unni ◽  
Khadidja Taleb ◽  
Jean-Paul Chapel ◽  
Nandakumar Kalarikkal ◽  
...  

2007 ◽  
Vol 61 (14-15) ◽  
pp. 2908-2910 ◽  
Author(s):  
Joseph Lik Hang Chau ◽  
Yu-Ming Lin ◽  
Ai-Kang Li ◽  
Wei-Fang Su ◽  
Kuo-Shin Chang ◽  
...  

2009 ◽  
Vol 24 (8) ◽  
pp. 2520-2527 ◽  
Author(s):  
Yonghao Lu ◽  
Junping Wang ◽  
Yaogen Shen ◽  
Dongbai Sun

A series of Ti-B-C-N thin films were deposited on Si (100) at 500 °C by incorporation of different amounts of N into Ti-B-C using reactive unbalanced dc magnetron sputtering in an Ar-N2 gas mixture. The effect of N content on phase configuration, nanostructure evolution, and mechanical behaviors was studied by x-ray diffraction, x-ray photoelectron spectroscopy, Raman spectroscopy, high-resolution transmission electron microscopy, and microindentation. It was found that the pure Ti-B-C was two-phased quasi-amorphous thin films comprising TiCx and TiB2. Incorporation of a small amount of N not only dissolved into TiCx but also promoted growth of TiCx nano-grains. As a result, nanocomposite thin films of nanocrystalline (nc-) TiCx(Ny) (x + y < 1) embedded into amorphous (a-) TiB2 were observed until nitrogen fully filled all carbon vacancy lattice (at that time x + y = 1). Additional increase of N content promoted formation of a-BN at the cost of TiB2, which produced nanocomposite thin films of nc-Ti(Cx,N1-x) embedded into a-(TiB2, BN). Formation of BN also decreased nanocrystalline size. Both microhardness and elastic modulus values were increased with an increase of N content and got their maximums at nanocomposite thin films consisting of nc-Ti(Cx,N1-x) and a-TiB2. Both values were decreased after formation of BN. Residual compressive stress value was successively decreased with an increase of N content. Enhancement of hardness was attributed to formation of nanocomposite structure and solid solution hardening.


2021 ◽  
Vol 204 ◽  
pp. 116499
Author(s):  
Koichi Tanaka ◽  
Michael E. Liao ◽  
Angel Aleman ◽  
Hicham Zaid ◽  
Mark S. Goorsky ◽  
...  

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