A spatially resolved retarding field energy analyzer design suitable for uniformity analysis across the surface of a semiconductor wafer
2014 ◽
Vol 85
(4)
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pp. 043509
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1985 ◽
Vol 24
(Part 1, No. 3)
◽
pp. 337-341
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Keyword(s):
2009 ◽
Vol 80
(10)
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pp. 103505
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1996 ◽
Vol 35
(Part 2, No. 9B)
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pp. L1219-L1221
2005 ◽
Vol 33
(2)
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pp. 336-337
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