Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

2014 ◽  
Vol 85 (4) ◽  
pp. 043703 ◽  
Author(s):  
Muthukumaran Loganathan ◽  
Douglas A. Bristow
Keyword(s):  
Atomic Force Microscopy ◽  
Measurement Sensitivity ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

TAPPING MODE ATOMIC FORCE MICROSCOPY OF HYALURONAN AND HYLAN A

Hyaluronan ◽  
2002 ◽  
pp. 109-116 ◽  
Author(s):  
Mary K. Cowman ◽  
Min Li ◽  
Ansil Dyal ◽  
Sonoko Kanai
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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