scholarly journals Low power zinc-oxide based charge trapping memory with embedded silicon nanoparticles via poole-frenkel hole emission

2014 ◽  
Vol 104 (1) ◽  
pp. 013112 ◽  
Author(s):  
Nazek El-Atab ◽  
Ayse Ozcan ◽  
Sabri Alkis ◽  
Ali K. Okyay ◽  
Ammar Nayfeh
Keyword(s):  
Zinc Oxide ◽  
Low Power ◽  
Silicon Nanoparticles ◽  
Charge Trapping ◽  
Charge Trapping Memory

Low Power Zinc-Oxide Based Charge Trapping Memory with Embedded Silicon Nanoparticles

2014 ◽  
Vol 64 (17) ◽  
pp. 45-49 ◽  
Author(s):  
A. Nayfeh ◽  
A. Okyay ◽  
N. El-Atab ◽  
A. Ozcan ◽  
S. Alkis
Keyword(s):  
Zinc Oxide ◽  
Low Power ◽  
Silicon Nanoparticles ◽  
Charge Trapping ◽  
Charge Trapping Memory

scholarly journals Zinc-oxide charge trapping memory cell with ultra-thin chromium-oxide trapping layer

AIP Advances ◽  
2013 ◽  
Vol 3 (11) ◽  
pp. 112116 ◽  
Author(s):  
Nazek El-Atab ◽  
Ayman Rizk ◽  
Ali K. Okyay ◽  
Ammar Nayfeh
Keyword(s):  
Zinc Oxide ◽  
Chromium Oxide ◽  
Charge Trapping ◽  
Memory Cell ◽  
Oxide Charge ◽  
Thin Chromium ◽  
Charge Trapping Memory

Characteristics of Band-to-Band Tunneling Hot Hole Injection for Erasing Operation in Charge-Trapping Memory

2006 ◽  
Vol 45 (4B) ◽  
pp. 3179-3184
Author(s):  
Lei Sun ◽  
Liyang Pan ◽  
Huiqing Pang ◽  
Ying Zeng ◽  
Zhaojian Zhang ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Hole Injection ◽  
Band To Band Tunneling ◽  
Charge Trapping Memory
Sign in / Sign up

Export Citation Format

Share Document