Amplitude evolution equation and transient effects in piezoelectric crystal resonators

2013 ◽  
Vol 114 (14) ◽  
pp. 144510 ◽  
Author(s):  
Zhi Wang ◽  
Minghao Zhao ◽  
Jiashi Yang
Author(s):  
J.A. Eades ◽  
A. van Dun

The measurement of magnification in the electron microscope is always troublesome especially when a goniometer stage is in use, since there can be wide variations from calibrated values. One elegant method (L.M.Brown, private communication) of avoiding the difficulties of standard methods would be to fit a device which displaces the specimen a small but known distance and recording the displacement by a double exposure. Such a device would obviate the need for changing the specimen and guarantee that the magnification was measured under precisely the conditions used.Such a small displacement could be produced by any suitable transducer mounted in one of the specimen translation mechanisms. In the present case a piezoelectric crystal was used. Modern synthetic piezo electric ceramics readily give reproducible displacements in the right range for quite modest voltages (for example: Joyce and Wilson, 1969).


Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.


1981 ◽  
Vol 42 (C4) ◽  
pp. C4-579-C4-582
Author(s):  
T. Shiraishi ◽  
D. Adler

2016 ◽  
pp. 4437-4439
Author(s):  
Adil Jhangeer ◽  
Fahad Al-Mufadi

In this paper, conserved quantities are computed for a class of evolution equation by using the partial Noether approach [2]. The partial Lagrangian approach is applied to the considered equation, infinite many conservation laws are obtained depending on the coefficients of equation for each n. These results give potential systems for the family of considered equation, which are further helpful to compute the exact solutions.


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