Nanomechanical imaging of soft samples in liquid using atomic force microscopy

2013 ◽  
Vol 114 (13) ◽  
pp. 134313 ◽  
Author(s):  
Majid Minary-Jolandan ◽  
Min-Feng Yu
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Samples

Phase Contrast Imaging in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1275-1276
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Contrast ◽  
Phase Changes ◽  
Phase Imaging ◽  
Phase Detection ◽  
Contrast Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Soft Samples

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

Correction of Microrheological Measurements of Soft Samples with Atomic Force Microscopy for the Hydrodynamic Drag on the Cantilever

Langmuir ◽  
2002 ◽  
Vol 18 (3) ◽  
pp. 716-721 ◽  
Author(s):  
J. Alcaraz ◽  
L. Buscemi ◽  
M. Puig-de-Morales ◽  
J. Colchero ◽  
A. Baró ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrodynamic Drag ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Samples

Atomic Force Microscopy of Soft Samples: Gelatin and Living Cells

1998 ◽  
pp. 178-193 ◽  
Author(s):  
Jan Domke ◽  
Christian Rotsch ◽  
Paul K. Hansma ◽  
Ken Jacobson ◽  
Manfred Radmacher
Keyword(s):  
Atomic Force Microscopy ◽  
Living Cells ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Samples

Measuring Viscoelasticity of Soft Samples Using Atomic Force Microscopy

2009 ◽  
Vol 131 (9) ◽  
Author(s):  
S. Tripathy ◽  
E. J. Berger
Keyword(s):  
Atomic Force Microscopy ◽  
Soft Tissues ◽  
Relaxation Times ◽  
Indentation Test ◽  
Strain History ◽  
Force Microscopy ◽  
Afm Indentation ◽  
Atomic Force ◽  
Dependent Part ◽  
Soft Samples

Relaxation indentation experiments using atomic force microscopy (AFM) are used to obtain viscoelastic material properties of soft samples. The quasilinear viscoelastic (QLV) model formulated by Fung (1972, “Stress Strain History Relations of Soft Tissues in Simple Elongation,” in Biomechanics, Its Foundation and Objectives, Prentice-Hall, Englewood Cliffs, NJ, pp. 181–207) for uniaxial compression data was modified for the indentation test data in this study. Hertz contact mechanics was used for the instantaneous deformation, and a reduced relaxation function based on continuous spectrum is used for the time-dependent part in the model. The modified QLV indentation model presents a novel method to obtain viscoelastic properties from indentation data independent of relaxation times of the test. The major objective of the present study is to develop the QLV indentation model and implement the model on AFM indentation data for 1% agarose gel and a viscoelastic polymer using spherical indenter.

scholarly journals Исследование структуры объемного гетероперехода в полимерных солнечных элементах с помощью комбинации ультрамикротомирования и атомно-силовой микроскопии

2018 ◽  
Vol 52 (1) ◽  
pp. 110
Author(s):  
А.М. Алексеев ◽  
A. Ал-Афееф ◽  
Г.Д. Хедли ◽  
С.С. Харинцев ◽  
А.Е. Ефимов ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Organic Solar Cells ◽  
Polymer Solar Cells ◽  
Structural Investigations ◽  
Photoactive Layer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bulk Structure ◽  
Soft Samples

AbstractA method for visualization via atomic-force microscopy of the internal structure of photoactive layers of polymer solar cells using an ultramicrotome for photoactive layer cutting is proposed and applied. The method creates an opportunity to take advantage of atomic-force microscopy in structural investigations of the bulk of soft samples. Such advantages of atomic-force microscopy include a high contrast and the ability to measure various surface properties at nanometer resolution. Using the proposed method, samples of the photoactive layer of polymer solar cells based on a mixture of PTB7 polythiophene and PC_71BM fullerene derivatives are studied. The disclosed details of the bulk structure of this mixture allow us to draw additional conclusions about the effect of morphology on the efficiency of organic solar cells.

scholarly journals Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience

2018 ◽  
Vol 7 (6) ◽  
pp. 605-621 ◽  
Author(s):  
Ke Xu ◽  
Weihang Sun ◽  
Yongjian Shao ◽  
Fanan Wei ◽  
Xiaoxian Zhang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Nanomechanical Property ◽  
High Resolution Imaging ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Quantitative Property ◽  
Resolution Imaging ◽  
Soft Samples

AbstractNanoscience is a booming field incorporating some of the most fundamental questions concerning structure, function, and applications. The cutting-edge research in nanoscience requires access to advanced techniques and instrumentation capable of approaching these unanswered questions. Over the past few decades, atomic force microscopy (AFM) has been developed as a powerful platform, which enables in situ characterization of topological structures, local physical properties, and even manipulating samples at nanometer scale. Currently, an imaging mode called PeakForce Tapping (PFT) has attracted more and more attention due to its advantages of nondestructive characterization, high-resolution imaging, and concurrent quantitative property mapping. In this review, the origin, principle, and advantages of PFT on nanoscience are introduced in detail. Three typical applications of this technique, including high-resolution imaging of soft samples in liquid environment, quantitative nanomechanical property mapping, and electrical/electrochemical property measurement will be reviewed comprehensively. The future trends of PFT technique development will be discussed as well.

Sign in / Sign up

Export Citation Format

Share Document