Electric-field-induced response of a droplet embedded in a polyelectrolyte gel

2013 ◽  
Vol 25 (8) ◽  
pp. 082004 ◽  
Author(s):  
Aliasghar Mohammadi
2015 ◽  
Vol 229 ◽  
pp. 104-109 ◽  
Author(s):  
F.A. Blyakhman ◽  
A.P. Safronov ◽  
T.F. Shklyar ◽  
M.A. Filipovich

1999 ◽  
Vol 600 ◽  
Author(s):  
T. Hirai ◽  
J. Zheng ◽  
M. Watanabe ◽  
H. Shirai ◽  
M. Yamaguchi

AbstractWe have found a nonionic polymer gel swollen with nonionic dielectric solvent can be actuated by applying an electric field. The motion was not only far much faster than conventional polyelectrolyte gel materials, but also far much bigger in deformation. The motion was completed, for instance, within 60 ms and the deformation reached over 100%. The heat loss is negligible compared to that of polyelectrolyte gels. The deformation is not only bending, but also crawling. The principle was suggested to be charge-injected solvent dragging in the gel. The force was suggested to be proportional to the square of the electric field and proportional to the dielectric constant of the solvent. The principle was suggested to be promising and applicable to other conventional polymers.


1992 ◽  
Vol 46 (4) ◽  
pp. 635-640 ◽  
Author(s):  
Tohru Shiga ◽  
Yoshiharu Hirose ◽  
Akane Okada ◽  
Toshio Kurauchi

Author(s):  
Aliasghar Mohammadi ◽  
Reghan J. Hill

The electric-field-induced response of an uncharged colloidal sphere embedded in a quenched polyelectrolyte hydrogel is calculated from a model where the polymer network is treated as an elastic, porous skeleton saturated with an aqueous electrolyte. We present exact analytical solutions for the steady response to a uniform electric field, as well as the steady susceptibility, defined as the ratio of the particle displacement to the strength of an optical or magnetic force. Even though the particle is uncharged, it attains a finite electric-field-induced displacement owing to hydrodynamic coupling with electroosmotic flow. The steady susceptibility decreases with increasing charge and decreasing electrolyte concentration; in general, charge imparts a small correction to the classical theory for an uncharged linearly elastic continuum.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1993 ◽  
Vol 3 (8) ◽  
pp. 1201-1225 ◽  
Author(s):  
G. N�ron de Surgy ◽  
J.-P. Chabrerie ◽  
O. Denoux ◽  
J.-E. Wesfreid

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