The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

Yuanmin Du; Amit Kumar; Hui Pan; Kaiyang Zeng; Shijie Wang; Ping Yang; Andrew Thye Shen Wee

doi:10.1063/1.4818119

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances ◽

10.1063/1.4818119 ◽

2013 ◽

Vol 3 (8) ◽

pp. 082107 ◽

Cited By ~ 30

Author(s):

Yuanmin Du ◽

Amit Kumar ◽

Hui Pan ◽

Kaiyang Zeng ◽

Shijie Wang ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Resistive Switching ◽

Kelvin Probe Force Microscopy ◽

Tio2 Films ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/26/34/345702 ◽

2015 ◽

Vol 26 (34) ◽

pp. 345702 ◽

Cited By ~ 21

Author(s):

Mohit Kumar ◽

Tapobrata Som

Keyword(s):

Atomic Force Microscopy ◽

Resistive Switching ◽

Structural Defect ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Gold-decorated highly ordered self-organized grating-like nanostructures on Ge surface: Kelvin probe force microscopy and conductive atomic force microscopy studies

Nanotechnology ◽

10.1088/0957-4484/27/43/435302 ◽

2016 ◽

Vol 27 (43) ◽

pp. 435302 ◽

Cited By ~ 4

Author(s):

Safiul Alam Mollick ◽

Mohit Kumar ◽

Ranveer Singh ◽

Biswarup Satpati ◽

Debabrata Ghose ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Self Organized ◽

Atomic Force

Download Full-text

Analysis of Dislocations in CdZnTe Epitaxial Film with Kelvin Probe and Conductive Atomic Force Microscopy

Journal of Electronic Materials ◽

10.1007/s11664-020-08094-x ◽

2020 ◽

Vol 49 (6) ◽

pp. 3907-3912

Author(s):

Kun Cao ◽

Wanqi Jie ◽

Gangqiang Zha ◽

Jiangpeng Dong ◽

Ruiqi Hu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Epitaxial Film ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

ACS Nano ◽

10.1021/acsnano.7b08997 ◽

2018 ◽

Vol 12 (6) ◽

pp. 5274-5283 ◽

Cited By ~ 16

Author(s):

Fabian Schulz ◽

Juha Ritala ◽

Ondrej Krejčí ◽

Ari Paavo Seitsonen ◽

Adam S. Foster ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy

Electrochimica Acta ◽

10.1016/j.electacta.2012.03.051 ◽

2012 ◽

Vol 70 ◽

pp. 228-240 ◽

Cited By ~ 11

Author(s):

B. Narsimha Reddy ◽

Melepurath Deepa

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Carbon Nanotube Composite

Download Full-text

Study of the Resistive Switching Effect in Chromium Oxide Thin Films by Use of Conductive Atomic Force Microscopy

Journal of Electronic Materials ◽

10.1007/s11664-015-3889-z ◽

2015 ◽

Vol 44 (10) ◽

pp. 3395-3400 ◽

Cited By ~ 4

Author(s):

Kim Ngoc Pham ◽

Minsu Choi ◽

Cao Vinh Tran ◽

Trung Do Nguyen ◽

Van Hieu Le ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Chromium Oxide ◽

Resistive Switching ◽

Switching Effect ◽

Oxide Thin Films ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Resistive Switching Effect

Download Full-text

Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

Ultramicroscopy ◽

10.1016/s0304-3991(02)00091-8 ◽

2002 ◽

Vol 91 (1-4) ◽

pp. 127-132 ◽

Cited By ~ 9

Author(s):

Shiano Ono ◽

Misaichi Takeuchi ◽

Takuji Takahashi

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Inas Nanowires ◽

Mode Atomic Force Microscopy

Download Full-text

Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips

Physical Review B ◽

10.1103/physrevb.90.155455 ◽

2014 ◽

Vol 90 (15) ◽

Cited By ~ 47

Author(s):

Leo Gross ◽

Bruno Schuler ◽

Fabian Mohn ◽

Nikolaj Moll ◽

Niko Pavliček ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Ionic Systems ◽

Functionalized Tips

Download Full-text

Electrochemical and atomic force microscopy investigations of the effect of CdS on the local electrical properties of CH3NH3PbI3:CdS perovskite solar cells

Journal of Materials Chemistry C ◽

10.1039/c7tc04377e ◽

2017 ◽

Vol 5 (46) ◽

pp. 12112-12120 ◽

Cited By ~ 10

Author(s):

Mingxuan Guo ◽

Fumin Li ◽

Lanyu Ling ◽

Chong Chen

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Electrochemical Impedance Spectroscopy ◽

Electrochemical Impedance ◽

Bulk Heterojunction ◽

Perovskite Solar Cells ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

The effect of the incorporated CdS on the local optoelectronic properties of CH3NH3PbI3:CdS bulk heterojunction (BHJ) perovskite solar cells (PSCs) are studied using Kelvin probe force microscopy (KPFM), conductive atomic force microscopy (c-AFM) and electrochemical impedance spectroscopy (EIS).

Download Full-text