A system for measuring complex dielectric properties of thin films at submillimeter wavelengths using an open hemispherical cavity and a vector network analyzer

2013 ◽  
Vol 84 (8) ◽  
pp. 083901 ◽  
Author(s):  
Rezwanur Rahman ◽  
P. C. Taylor ◽  
John A. Scales
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Measuring Complex ◽  
Submillimeter Wavelengths

scholarly journals Automated Measuring Complex for the Research of the Frequency Characteristics of Microwave Filters in a Wide Range of Frequencies

2019 ◽  
pp. 765-772
Author(s):  
Andrey B. Gladyshev ◽  
Dmitry D. Dmitriev ◽  
Peter Yu. Zverev ◽  
Ivan A. Smolev
Keyword(s):  
Frequency Characteristics ◽  
Signal Generator ◽  
Spectrum Analyzer ◽  
Vector Network Analyzer ◽  
Microwave Filters ◽  
Output Power Level ◽  
Network Analyzer ◽  
Measuring Complex ◽  
Vector Network Analyzers ◽  
Network Analyzers

The article proposes a variant of an automated measuring complex designed to study the frequency characteristics of microwave filters. When developing microwave filters, it is necessary to control their frequency parameters, for which standard instruments are used – vector network analyzers. However, new technologies for manufacturing microwave filters, aimed at improving the frequency-selective characteristics and miniaturizing the design, do not allow for comprehensive studies using only one vector network analyzer. This is mainly due to the insufficient dynamic range of the vector network analyzers, which does not allow for a qualitative measurement of such parameters as attenuation in the filter barrier bands. This problem can be easily solved using a signal generator with an increased output power level and a spectrum analyzer. For a comprehensive study of the characteristics of microwave filters, a combination of methods for measuring the parameters of microwave filters is proposed, where the main characteristics will be measured in the passband using a vector network analyzer and the parameters of the obstacle bands using a signal generator and spectrum analyzer. By connecting devices into a network under the control of special software, we obtain a flexible and convenient system for automated research of the characteristics of microwave filters

scholarly journals Vector Network Analyzer Ferromagnetic Resonance Study of Py Thin Films

2010 ◽  
Vol 20 (1) ◽  
pp. 18-23 ◽  
Author(s):  
Yong-Hwack Shin ◽  
Seung-Seok Ha ◽  
Duck-Ho Kim ◽  
Chun-Yeol You
Keyword(s):  
Thin Films ◽  
Ferromagnetic Resonance ◽  
Vector Network Analyzer ◽  
Network Analyzer

scholarly journals MEASURING COMPLEX OF TESTING AND CALIBRATION OF POWER METERS IN THE MILLIMETER RANGE OF WAVES LENGTH

Doklady BGUIR ◽  
2019 ◽  
pp. 50-54
Author(s):  
A. V. Gusinsky
Keyword(s):  
Measurement Error ◽  
Wavelength Range ◽  
Vector Network Analyzer ◽  
Power Measurement ◽  
Network Analyzer ◽  
Mismatch Error ◽  
Millimeter Wavelength ◽  
Measuring Complex

The structure of the construction of the calibration measuring complex and calibration of the power meters in the millimeter wavelength range is given. The possibility of correcting one of the dominant components of the power measurement error, the mismatch error when using a vector network analyzer, is considered.  

Reconfigurable SDM Optical Vector Network Analyzer

2014 ◽  
Author(s):  
Joel Carpenter ◽  
Benjamin J. Eggleton ◽  
Jochen Schröder
Keyword(s):  
Vector Network Analyzer ◽  
Network Analyzer

IN-PLANE DIELECTRIC PROPERTIES OF BST THIN FILMS GROWN ON MgO SUBSTRATES USING THE THIN PEROVSKITE LAYERS FOR MICROWAVE TUNABLE ELECTRONICS

2006 ◽  
Vol 86 (1) ◽  
pp. 159-169 ◽  
Author(s):  
SU-JAE LEE ◽  
HAN-CHEOL RYU ◽  
YOUNG-TAE KIM ◽  
MIN-HWAN KWAK ◽  
SEUNGEON MOON ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Bst Thin Films
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