Linear thermal expansion coefficient determination using in situ curvature and temperature dependent X-ray diffraction measurements applied to metalorganic vapor phase epitaxy-grown AlGaAs
2017 ◽
Vol 254
(5)
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pp. 1600695
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2011 ◽
Vol 299-300
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pp. 47-50
2009 ◽
Vol 24
(6)
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pp. 1989-1993
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2016 ◽
Vol 23
(3)
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pp. 718-728
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2011 ◽
Vol 311-313
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pp. 764-767
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