Phase shift cavity ring down and Fourier transform infrared measurements of C–H vibrational transitions, energy levels, and intensities of (CH3)3Si–C≡C–H

2013 ◽  
Vol 139 (1) ◽  
pp. 014311 ◽  
Author(s):  
Jenny Z. Barroso ◽  
Yasnahir Perez-Delgado ◽  
Carlos E. Manzanares
Keyword(s):  
Fourier Transform ◽  
Phase Shift ◽  
Energy Levels ◽  
Fourier Transform Infrared ◽  
Infrared Measurements ◽  
Vibrational Transitions ◽  
Cavity Ring Down

Fourier transform infrared phase shift cavity ring down spectrometer

2013 ◽  
Author(s):  
Elizabeth Schundler ◽  
David J. Mansur ◽  
Robert Vaillancourt ◽  
Ryan Benedict-Gill ◽  
Scott P. Newbry ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Phase Shift ◽  
Fourier Transform Infrared ◽  
Cavity Ring Down

Fourier transform infrared phase shift cavity ring down spectrometer

2014 ◽  
Author(s):  
Elizabeth Schundler ◽  
David J. Mansur ◽  
Robert Vaillancourt ◽  
Ryan Benedict-Gill ◽  
Scott P. Newbry ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Phase Shift ◽  
Fourier Transform Infrared ◽  
Cavity Ring Down

Low Temperature Evaluation of Carbon and Oxygen Contaminants in Silicon

1980 ◽  
Vol 34 (2) ◽  
pp. 171-173 ◽  
Author(s):  
D. G. Mead
Keyword(s):  
Fourier Transform ◽  
Low Temperature ◽  
Room Temperature ◽  
Fourier Transform Infrared ◽  
Spectral Subtraction ◽  
Atomic Carbon ◽  
Infrared Measurements ◽  
Oxygen Concentrations

Low temperature Fourier transform infrared measurements at 20 K on some wafers containing substitutional atomic carbon and oxygen are presented. Spectral subtraction techniques at 20 K indicate an increase of approximately 5 times in sensitivity compared to the room temperature evaluation of the carbon and oxygen concentrations.

Evaluation of Carbon and Oxygen Content of Silicon Wafers Using Infrared Absorption

1980 ◽  
Vol 34 (2) ◽  
pp. 167-171 ◽  
Author(s):  
D. G. Mead ◽  
S. R. Lowry
Keyword(s):  
Fourier Transform ◽  
Oxygen Content ◽  
Infrared Absorption ◽  
Room Temperature ◽  
Fourier Transform Infrared ◽  
Silicon Wafers ◽  
Reference Standard ◽  
Infrared Measurements ◽  
Oxygen Concentrations

Room temperature Fourier transform infrared measurements on some contaminated silicon wafers are presented. Use of subtractive techniques readily allows both carbon and oxygen concentrations of about 0.1 ppm atomic to be obtained in relatively short measurement times (about 1 min), providing an adequate “pure” wafer is used as the reference standard.

scholarly journals Quantifying fugitive gas emissions from an oil sands tailings pond with open-path Fourier transform infrared measurements

2021 ◽  
Vol 14 (2) ◽  
pp. 945-959
Author(s):  
Yuan You ◽  
Samar G. Moussa ◽  
Lucas Zhang ◽  
Long Fu ◽  
James Beck ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Oil Sands ◽  
Measurement Techniques ◽  
Flux Measurement ◽  
Fourier Transform Infrared ◽  
Inverse Dispersion ◽  
Nh3 Emission ◽  
Open Path ◽  
Infrared Measurements ◽  
Emission Fluxes

Abstract. Fugitive emissions from tailings ponds contribute significantly to facility emissions in the Alberta oil sands, but details on chemical emission profiles and the temporal and spatial variability of emissions to the atmosphere are sparse, since flux measurement techniques applied for compliance monitoring have their limitations. In this study, open-path Fourier transform infrared spectroscopy was evaluated as a potential alternative method for quantifying spatially representative fluxes for various pollutants (methane, ammonia, and alkanes) from a particular pond, using vertical-flux-gradient and inverse-dispersion methods. Gradient fluxes of methane averaged 4.3 g m−2 d−1 but were 44 % lower than nearby eddy covariance measurements, while inverse-dispersion fluxes agreed to within 30 %. With the gradient fluxes method, significant NH3 emission fluxes were observed (0.05 g m−2 d−1, 42 t yr−1), and total alkane fluxes were estimated to be 1.05 g m−2 d−1 (881 t yr−1), representing 9.6 % of the facility emissions.

Multipass open-path Fourier-transform infrared measurements for nonintrusive monitoring of gas turbine exhaust composition

2005 ◽  
Vol 44 (11) ◽  
pp. 2189 ◽  
Author(s):  
Klaus Schäfer ◽  
Klaus Brockmann ◽  
Jörg Heland ◽  
Peter Wiesen ◽  
Carsten Jahn ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Gas Turbine ◽  
Fourier Transform Infrared ◽  
Open Path ◽  
Infrared Measurements ◽  
Gas Turbine Exhaust ◽  
Nonintrusive Monitoring ◽  
Turbine Exhaust
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