Effect of oxygen pressure on the structural and optical properties of ZnO/Si(100) thin films

2013 ◽  
Author(s):  
Sanjeev Gautam ◽  
Anup Thakur ◽  
Ankush Vij ◽  
Seonghoon Jung ◽  
Ik Jae Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Oxygen Pressure ◽  
Structural And Optical Properties ◽  
Effect Of Oxygen

Effect of oxygen partial pressure on the structural and optical properties of ion beam sputtered TiO2 thin films

2016 ◽  
Vol 619 ◽  
pp. 86-90 ◽  
Author(s):  
Firdous A. Tantray ◽  
Arpana Agrawal ◽  
Mukul Gupta ◽  
Joseph T. Andrews ◽  
Pratima Sen
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Oxygen Partial Pressure ◽  
Partial Pressure ◽  
Ion Beam ◽  
Structural And Optical Properties ◽  
Tio2 Thin Films ◽  
Effect Of Oxygen

CHARACTERIZATION OF AlN THIN FILMS FABRICATED BY REACTIVE DC SPUTTERING: EXPERIMENTAL MEASUREMENTS AND HÜCKEL CALCULATIONS

2009 ◽  
Vol 23 (09) ◽  
pp. 2233-2251 ◽  
Author(s):  
MANUEL GARCÍA-MÉNDEZ ◽  
SANTOS MORALES-RODRÍGUEZ ◽  
DONALD H. GALVÁN ◽  
ROBERTO MACHORRO
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Optical Measurements ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Zinc Blende ◽  
Single Oscillator ◽  
Effect Of Oxygen ◽  
Oxygen Impurities

A set of AlN thin films was prepared by reactive magnetron sputtering at room temperature. The effect of oxygen impurities on the structural and optical properties of AlN films is discussed. The structural and optical properties were characterized using X-ray diffraction (XRD) and spectroscopic ellipsometry, respectively. Depending on the deposition conditions, films can grow hexagonal (würzite, P 63 m 3) or cubic (zinc-blende, Fm3m) in microstructure. From the optical measurements, the ellipsometric parameters (ψ, Δ) and the real refractive index as a function of energy were obtained. From the ellipsometric measurements, a model of Lorentz single-oscillator was employed to estimate the optical band gap, Eg. In the theoretical part, a calculation of density of states (DOS) and band structure was performed to be compared with the experimental results.

scholarly journals Effect of oxygen partial pressure on the structural and optical properties of ion beam sputtered TiO2 thin films

2016 ◽  
Vol 755 ◽  
pp. 012053
Author(s):  
Firdous A Tantray ◽  
Romita Chouhan ◽  
Swati Rajput ◽  
Arpana Agrawal ◽  
Joseph T Andrews ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Oxygen Partial Pressure ◽  
Partial Pressure ◽  
Ion Beam ◽  
Structural And Optical Properties ◽  
Tio2 Thin Films ◽  
Effect Of Oxygen
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