Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm

2013 ◽  
Author(s):  
Sanjaykumar J. Patel ◽  
Vipul Kheraj
Keyword(s):  
Thin Film ◽  
Genetic Algorithm ◽  
Refractive Index ◽  
Reflectivity Spectrum

Determination of thin film refractive index and thickness by means of film phase thickness

Open Physics ◽  
2008 ◽  
Vol 6 (2) ◽  
Author(s):  
Milen Nenkov ◽  
Tamara Pencheva
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Refractive Index ◽  
Barium Titanate ◽  
Spectral Region ◽  
Complex Refractive Index ◽  
Refractive Index Dispersion ◽  
New Approach ◽  
Phase Thickness

AbstractA new approach for determination of refractive index dispersion n(λ) (the real part of the complex refractive index) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate thin films are investigated in the spectral region 0.38–0.78 μm and their n(λ) and d are calculated. The approach is validated using Swanepoel’s method and it is found to be applicable for relatively thin films when measured transmittance spectra have one minimum and one maximum only.

Determination of the Thickness and Refractive Index of Cu2O Thin Film Using Thermal and Optical Interferometry

1986 ◽  
Vol 93 (2) ◽  
pp. 613-620 ◽  
Author(s):  
M. E. Abu-Zeid ◽  
A. E. Rakhshani ◽  
A. A. Al-Jassar ◽  
Y. A. Youssef
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Optical Interferometry ◽  
Cu2o Thin Film
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