Numerical reconstruction of volumetric image in swept-source interference microscopy

2013 ◽  
Author(s):  
Anton A. Grebenyuk ◽  
Vladimir P. Ryabukho
Keyword(s):  
Interference Microscopy ◽  
Swept Source ◽  
Numerical Reconstruction

Numerical correction of coherence gate in full-field swept-source interference microscopy

2012 ◽  
Vol 37 (13) ◽  
pp. 2529 ◽  
Author(s):  
Anton A. Grebenyuk ◽  
Vladimir P. Ryabukho
Keyword(s):  
Interference Microscopy ◽  
Swept Source ◽  
Full Field

Electron holography in materials science

1991 ◽  
Vol 49 ◽  
pp. 670-671
Author(s):  
Hannes Lichte ◽  
Edgar Voelkl
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Fourier Spectrum ◽  
Object Wave ◽  
Electron Holography ◽  
Reconstruction Procedure ◽  
Numerical Reconstruction ◽  
Transmission Electron ◽  
Unique Interpretation

The object wave o(x,y) = a(x,y)exp(iφ(x,y)) at the exit face of the specimen is described by two real functions, i.e. amplitude a(x,y) and phase φ(x,y). In stead of o(x,y), however, in conventional transmission electron microscopy one records only the real intensity I(x,y) of the image wave b(x,y) loosing the image phase. In addition, referred to the object wave, b(x,y) is heavily distorted by the aberrations of the microscope giving rise to loss of resolution. Dealing with strong objects, a unique interpretation of the micrograph in terms of amplitude and phase of the object is not possible. According to Gabor, holography helps in that it records the image wave completely by both amplitude and phase. Subsequently, by means of a numerical reconstruction procedure, b(x,y) is deconvoluted from aberrations to retrieve o(x,y). Likewise, the Fourier spectrum of the object wave is at hand. Without the restrictions sketched above, the investigation of the object can be performed by different reconstruction procedures on one hologram. The holograms were taken by means of a Philips EM420-FEG with an electron biprism at 100 kV.

Scanning Electron Microscopy and Electron Microprobe Analysis of Malignant Cell Cultures

1968 ◽  
Vol 26 ◽  
pp. 164-165
Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Cell Cultures ◽  
Electron Microprobe ◽  
Microprobe Analysis ◽  
Electron Microprobe Analysis ◽  
Three Dimensional ◽  
Malignant Cell ◽  
Interference Microscopy ◽  
Scanning Electron

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).

scholarly journals Laser Lens Size Measurement Using Swept-Source Optical Coherence Tomography

2020 ◽  
Vol 10 (14) ◽  
pp. 4936
Author(s):  
Pingping Jia ◽  
Hong Zhao ◽  
Yuwei Qin
Keyword(s):  
Optical Coherence Tomography ◽  
High Speed ◽  
Wave Number ◽  
Radius Of Curvature ◽  
Optical Coherence ◽  
Swept Source ◽  
Laser Focusing ◽  
Fitting Algorithm ◽  
Laser Confocal Microscope ◽  
Focusing Lens

A high-speed, high-resolution swept-source optical coherence tomography (SS-OCT) is presented for focusing lens imaging and a k-domain uniform algorithm is adopted to find the wave number phase equalization. The radius of curvature of the laser focusing lens was obtained using a curve-fitting algorithm. The experimental results demonstrate that the measuring accuracy of the proposed SS-OCT system is higher than the laser confocal microscope. The SS-OCT system has great potential for surface topography measurement and defect inspection of the focusing lens.

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