Longitudinal spatial coherence of the optical field and its effects in the interference microscopy

2013 ◽  
Author(s):  
Dmitry Lyakin ◽  
Vladislav Lychagov ◽  
Ilya Smirnov ◽  
Sergey Klykov ◽  
Anton Sdobnov ◽  
...  
2014 ◽  
Vol 31 (6) ◽  
pp. A51 ◽  
Author(s):  
Brandon Rodenburg ◽  
Mohammad Mirhosseini ◽  
Omar S. Magaña-Loaiza ◽  
Robert W. Boyd

2020 ◽  
Vol 59 (13) ◽  
pp. D21 ◽  
Author(s):  
Román Castañeda ◽  
Julián Laverde ◽  
Jaime Moreno

Author(s):  
R. I. Johnsson-Hegyeli ◽  
A. F. Hegyeli ◽  
D. K. Landstrom ◽  
W. C. Lane

Last year we reported on the use of reflected light interference microscopy (RLIM) for the direct color photography of the surfaces of living normal and malignant cell cultures without the use of replicas, fixatives, or stains. The surface topography of living cells was found to follow underlying cellular structures such as nuceloli, nuclear membranes, and cytoplasmic organelles, making possible the study of their three-dimensional relationships in time. The technique makes possible the direct examination of cells grown on opaque as well as transparent surfaces. The successful in situ electron microprobe analysis of the elemental composition and distribution within single tissue culture cells was also reported.This paper deals with the parallel and combined use of scanning electron microscopy (SEM) and the two previous techniques in a study of living and fixed cancer cells. All three studies can be carried out consecutively on the same experimental specimens without disturbing the cells or their structural relationships to each other and the surface on which they are grown. KB carcinoma cells were grown on glass coverslips in closed Leighto tubes as previously described. The cultures were photographed alive by means of RLIM, then fixed with a fixative modified from Sabatini, et al (1963).


Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.


2020 ◽  
Vol 8 (20) ◽  
pp. 6832-6838 ◽  
Author(s):  
Da Teng ◽  
Kai Wang ◽  
Qiongsha Huan ◽  
Weiguang Chen ◽  
Zhe Li

Tunable ultra-deep subwavelength optical field confinement is reported by using a graphene-coated nanowire-loaded silicon nano-rib waveguide.


Sign in / Sign up

Export Citation Format

Share Document