Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response

2013 ◽  
Vol 102 (19) ◽  
pp. 192906 ◽  
Author(s):  
Y. Bastani ◽  
A. Y. Cortés-Peña ◽  
A. D. Wilson ◽  
S. Gerardin ◽  
M. Bagatin ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Proton Irradiation ◽  
Lead Zirconate ◽  
High Energy ◽  
Piezoelectric Response ◽  
X Ray ◽  
Zirconate Titanate

Lead Zirconate-Titanate Thin Films Prepared by the Laser Ablation Technique

1990 ◽  
Vol 200 ◽  
Author(s):  
C. K. Chiang ◽  
L. P. Cook ◽  
P. K. Schenck ◽  
P. S. Brody ◽  
J. M. Benedetto
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Ablation Technique ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Plate Type ◽  
Laser Ablation Technique

ABSTRACTLead zirconate-titanate (PZT) thin films were prepared by the laser ablation technique. The PZT (Zr/Ti=53/47) target was irradiated using a focused q-switched Nd:YAG laser (15 ns, 100 mJ at 1.064 μ;m). The as-deposited films were amorphous as indicated by X-ray powder patterns, but crystallized readily with brief annealing above 650°C. The dielectric constant and the resistivity of the crystallized films were studied using a parallel-plate type capacitor structure.

In-situ X-ray studies of phase transformations in lead zirconate titanate thin films during annealing

1995 ◽  
Vol 268 (1-2) ◽  
pp. 102-107 ◽  
Author(s):  
P. Aungkavattana ◽  
B. Haartz ◽  
C.O. Ruud ◽  
S. Trolier-McKinstry
Keyword(s):  
Thin Films ◽  
Phase Transformations ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray ◽  
Zirconate Titanate

Enhanced Piezoelectric Response in Nano-Patterned Lead Zirconate Titanate Thin Films

2012 ◽  
Vol 51 (11S) ◽  
pp. 11PG04
Author(s):  
Martin Waegner ◽  
Mathias Schröder ◽  
Gunnar Suchaneck ◽  
Heinz Sturm ◽  
Christiane Weimann ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Zirconate Titanate

scholarly journals Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3338
Author(s):  
Thomas W. Cornelius ◽  
Cristian Mocuta ◽  
Stéphanie Escoubas ◽  
Luiz R. M. Lima ◽  
Eudes B. Araújo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Fields ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ac Electric Fields ◽  
Zirconate Titanate

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.

Enhanced Piezoelectric Response in Nano-Patterned Lead Zirconate Titanate Thin Films

2012 ◽  
Vol 51 ◽  
pp. 11PG04 ◽  
Author(s):  
Martin Waegner ◽  
Mathias Schröder ◽  
Gunnar Suchaneck ◽  
Heinz Sturm ◽  
Christiane Weimann ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Zirconate Titanate

Electrode size dependence of piezoelectric response of lead zirconate titanate thin films measured by double beam laser interferometry

2013 ◽  
Vol 103 (13) ◽  
pp. 132904 ◽  
Author(s):  
S. Sivaramakrishnan ◽  
P. Mardilovich ◽  
A. Mason ◽  
A. Roelofs ◽  
T. Schmitz-Kempen ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Size Dependence ◽  
Laser Interferometry ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Electrode Size ◽  
Beam Laser ◽  
Zirconate Titanate ◽  
Double Beam

Characterization of Lead Zirconate-Titanate Thin Films Prepared by Pulsed Laser Deposition

1991 ◽  
Vol 230 ◽  
Author(s):  
C. K. Chiang ◽  
W. Wong-Ng ◽  
P. K. Schenck ◽  
L. P. Cook ◽  
M. D. Vaudin ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Laser Deposition ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Zirconate Titanate ◽  
Deposited Films ◽  
Post Deposition

AbstractDense smooth lead zirconate-titanate thin films have been prepared by excimer laser deposition. The as-deposited films are amorphous as indicated by x-ray powder patterns. Differential scanning calorimetry studies show that the film has a glass transition at 301 °C, and the amorphous to crystalline transformation takes place above 350°C to 650°C. Phase formation as a result of post-deposition heat treatment is described.

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