Kelvin force microscopy characterization of charging effect in thin a-SiOxNy:H layers deposited in pulsed plasma enhanced chemical vapor deposition process by tuning the Silicon-environment
1991 ◽
Vol 137-138
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pp. 741-744
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2010 ◽
Vol 205
(7)
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pp. 2322-2327
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1988 ◽
Vol 9
(3)
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pp. 237-249
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1993 ◽
Vol 140
(12)
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pp. 3588-3590
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2011 ◽
Vol 115
(37)
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pp. 10290-10298
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