Quantitative determination of sheet resistance of semiconducting films by microwave near-field probing
2014 ◽
Vol 8
(3)
◽
pp. 477-483
SCANNING NEAR-FIELD MAGNETO-OPTIC MICROSCOPY: QUANTITATIVE DETERMINATION OF FARADAY AND KERR EFFECTS
1998 ◽
Vol 22
(S_2_MORIS_97)
◽
pp. S2_27-30
Keyword(s):
Keyword(s):