Optical characterization of free electron concentration in heteroepitaxial InN layers using Fourier transform infrared spectroscopy and a 2 × 2 transfer-matrix algebra
1988 ◽
Vol 944
(2)
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pp. 265-272
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2014 ◽
Vol 66
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pp. 136-140
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2014 ◽
Vol 48
(9)
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pp. 1502-1510
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2020 ◽
Vol 53
(16)
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pp. 2656-2670
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2014 ◽
Vol 43
(5)
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pp. 345-354
2015 ◽
Vol 48
(15)
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pp. 2380-2390
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1993 ◽
Vol 97
(35)
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pp. 9028-9033
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