Optical characterization of free electron concentration in heteroepitaxial InN layers using Fourier transform infrared spectroscopy and a 2 × 2 transfer-matrix algebra

2013 ◽  
Vol 113 (7) ◽  
pp. 073502 ◽  
Author(s):  
C. C. Katsidis ◽  
A. O. Ajagunna ◽  
A. Georgakilas
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