Transverse beam profile measurements of laser accelerated electrons using coherent optical radiation

2013 ◽  
Author(s):  
N. Bourgeois ◽  
M. Heigoldt ◽  
W. Rittershofer ◽  
A. Popp ◽  
K. Khrennikov ◽  
...  
Keyword(s):  
Optical Radiation ◽  
Beam Profile ◽  
Transverse Beam ◽  
Accelerated Electrons

scholarly journals Reply to “Comment on `Uniformization of the transverse beam profile by means of nonlinear focusing method’”

2008 ◽  
Vol 11 (3) ◽  
Author(s):  
Yosuke Yuri ◽  
Nobumasa Miyawaki ◽  
Tomihiro Kamiya ◽  
Watalu Yokota ◽  
Kazuo Arakawa ◽  
...  
Keyword(s):  
Beam Profile ◽  
Transverse Beam ◽  
Nonlinear Focusing

scholarly journals Uniform transverse beam profile with a new type of nonlinear magnet

2017 ◽  
Vol 41 (6) ◽  
pp. 067003
Author(s):  
Sheng-Dong Gu ◽  
Wei-Bin Liu
Keyword(s):  
Beam Profile ◽  
Transverse Beam ◽  
New Type

Review of Transverse Beam Profile Measurements Using Synchrotron Radiation

2020 ◽  
Vol 1 (2) ◽  
pp. 13-18
Author(s):  
Emy Mulyani, J.W. Flanagan
Keyword(s):  
Synchrotron Radiation ◽  
Visible Light ◽  
Beam Profile ◽  
Electromagnetic Spectrum ◽  
Transverse Beam ◽  
X Ray ◽  
Light Region ◽  
Broad Energy Range ◽  
Practical Experiences ◽  
Non Destructive

Abstract –Synchrotron radiation (SR) is a tool for non-destructive beam diagnostics since its characters are substantially related to those of the source beam. The spectrum of SR is extremely intense and extends over a broad energy range from the infrared through the visible and ultraviolet, into the soft and hard X-ray regions of the electromagnetic spectrum. The visible light (400 – 800 nm) and X-ray (0.05 – 0.3 nm) regions are used in the beam instrumentation. In the visible light region, transverse beam profile or size diagnostics can be done by an interferometer (light is observed as a wave). Meanwhile, in the submicron beam size measurements, the X-ray SR monitor is commonly used. This paper reports the review of transverse beam profile measurements using SR covering principles and practical experiences with the technique at some accelerator facilities such as Photon Factory, Diamond Light Source, CesrTA, and SuperKEKB. Key words: accelerator, beam instrumentation, transverse beam profile, synchrotron radiation, X-ray, visible light

scholarly journals Evaluation of 2-D Transverse Beam Profile Monitor Using Gas Sheet at J-PARC LINAC

2019 ◽  
Vol 1350 ◽  
pp. 012149
Author(s):  
J Kamiya ◽  
K. Okabe ◽  
M. Kinsho ◽  
K. Moriya ◽  
I. Yamada ◽  
...  
Keyword(s):  
Beam Profile ◽  
Transverse Beam ◽  
Beam Profile Monitor

scholarly journals Uniformization of the transverse beam profile by means of nonlinear focusing method

2007 ◽  
Vol 10 (10) ◽  
Author(s):  
Yosuke Yuri ◽  
Nobumasa Miyawaki ◽  
Tomihiro Kamiya ◽  
Watalu Yokota ◽  
Kazuo Arakawa ◽  
...  
Keyword(s):  
Beam Profile ◽  
Transverse Beam ◽  
Nonlinear Focusing
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