Trimethyl-aluminum and ozone interactions with graphite in atomic layer deposition of Al2O3

2012 ◽  
Vol 112 (10) ◽  
pp. 104110 ◽  
Author(s):  
Stephen McDonnell ◽  
Adam Pirkle ◽  
Jiyoung Kim ◽  
Luigi Colombo ◽  
Robert M. Wallace
Langmuir ◽  
2014 ◽  
Vol 30 (13) ◽  
pp. 3741-3748 ◽  
Author(s):  
Moataz Bellah M. Mousa ◽  
Christopher J. Oldham ◽  
Gregory N. Parsons

2014 ◽  
Vol 563 ◽  
pp. 44-49
Author(s):  
A. Lamperti ◽  
A. Molle ◽  
E. Cianci ◽  
C. Wiemer ◽  
S. Spiga ◽  
...  

2010 ◽  
Vol 49 (11) ◽  
pp. 111201 ◽  
Author(s):  
Hai-Dang Trinh ◽  
Edward Yi Chang ◽  
Yuen-Yee Wong ◽  
Chih-Chieh Yu ◽  
Chia-Yuan Chang ◽  
...  

RSC Advances ◽  
2017 ◽  
Vol 7 (2) ◽  
pp. 884-889 ◽  
Author(s):  
Taejin Park ◽  
Hoijoon Kim ◽  
Mirine Leem ◽  
Wonsik Ahn ◽  
Seongheum Choi ◽  
...  

The adsorption energies of trimethyl-aluminum on 2D crystals are extracted by quantifying the surface coverage of Al2O3 grown by atomic layer deposition.


2004 ◽  
Vol 811 ◽  
Author(s):  
Xinye Liu ◽  
Sasangan Ramanathan ◽  
Eddie Lee ◽  
Thomas E. Seidel

AbstractAluminum nitride (AlN) thin films were deposited from trimethyl aluminum (TMA) and Ammonia (NH3) by thermal atomic layer deposition (thermal ALD) and plasma enhanced atomic layer deposition (PEALD) on 200 mm silicon wafers. For both thermal ALD and PEALD, the deposition rate increased significantly with the deposition temperature. The deposition rate did not fully saturate even with 10 seconds of NH3 pulse time. Plasma significantly increased the deposition rate of AlN films. A large number of incubation cycles were needed to deposit AlN films on Si wafers. 100% step coverage was achieved on trenches with aspect ratio of 35:1 at 100 nm feature size by thermal ALD. X-ray diffraction (XRD) data showed that the AlN films deposited from 370 °C to 470 °C were polycrystalline. Glancing angle X-ray reflection (XRR) results showed that the RMS roughness of the films increased as the film thickness increased.


2021 ◽  
Vol 3 (1) ◽  
pp. 59-71
Author(s):  
Degao Wang ◽  
Qing Huang ◽  
Weiqun Shi ◽  
Wei You ◽  
Thomas J. Meyer

Sign in / Sign up

Export Citation Format

Share Document