scholarly journals Binary nucleation of sulfuric acid-water: Monte Carlo simulation

1998 ◽  
Vol 108 (16) ◽  
pp. 6829-6848 ◽  
Author(s):  
I. Kusaka ◽  
Z.-G. Wang ◽  
J. H. Seinfeld
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Sulfuric Acid ◽  
Acid Water ◽  
Binary Nucleation

scholarly journals Corrosion Inhibition of Mild Steel in Sulfuric Acid by a Newly Synthesized Schiff Base: An Electrochemical, DFT, and Monte Carlo Simulation Study

2020 ◽  
Vol 32 (12) ◽  
pp. 3145-3158
Author(s):  
Mostafa H. Sliem ◽  
N. M. El Basiony ◽  
E. G. Zaki ◽  
Mohammed A. Sharaf ◽  
Aboubakr M. Abdullah
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Schiff Base ◽  
Sulfuric Acid ◽  
Mild Steel ◽  
Corrosion Inhibition ◽  
Simulation Study ◽  
Monte Carlo Simulation Study

scholarly journals Binary nucleation in acid–water systems. II. Sulfuric acid–water and a comparison with methanesulfonic acid–water

1991 ◽  
Vol 94 (10) ◽  
pp. 6842-6850 ◽  
Author(s):  
B. E. Wyslouzil ◽  
J. H. Seinfeld ◽  
R. C. Flagan ◽  
K. Okuyama
Keyword(s):  
Sulfuric Acid ◽  
Methanesulfonic Acid ◽  
Water Systems ◽  
Acid Water ◽  
Binary Nucleation

scholarly journals Roles of Organic Emissions in the Formation of Near Field Aircraft-Emitted Volatile Particulate Matter: A Kinetic Microphysical Modeling Study

2015 ◽  
Vol 137 (7) ◽  
Author(s):  
Hsi-Wu Wong ◽  
Mina Jun ◽  
Jay Peck ◽  
Ian A. Waitz ◽  
Richard C. Miake-Lye
Keyword(s):  
Sulfuric Acid ◽  
Relative Humidity ◽  
Ambient Temperature ◽  
Near Field ◽  
Water Soluble ◽  
Acid Water ◽  
Organic Vapors ◽  
Nucleation Mode ◽  
Ambient Relative Humidity ◽  
Binary Nucleation

A kinetic microphysical modeling approach that describes the formation of volatile aerosols in the presence of organic emissions in near field aircraft emitted plumes at ground level is presented. Our model suggests that self nucleation of organic species, binary nucleation of water-soluble organic vapors with water, and multicomponent nucleation of water-soluble organic vapors with sulfuric acid and water all have very slow nucleation rates. The formation of new homogeneous particles in near field aircraft plumes is thus considered to be driven by binary nucleation of sulfuric acid and water. Volatile organic vapors emitted from aircraft engines primarily contribute to the nucleation process by condensing on existing homogeneous aerosols and only affect the size and the composition (not the number) of the homogeneous aerosols. Our model also shows that under low ambient relative humidity levels or high ambient temperatures, nucleation mode particles are more organic-rich than soot coatings. Organic mass fraction of nucleation mode particles is more sensitive to organic emissions levels compared to that of soot coatings. Ambient temperature and relative humidity were also predicted to affect the nucleation of sulfuric acid–water cores, where higher ambient relative humidity level and lower ambient temperature strongly favor binary sulfuric acid–water nucleation. The effect of ambient conditions on organic fractions was predicted to be relatively insignificant.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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