Halo formation and self-pinching of an electron beam undergoing the Weibel instability

2012 ◽  
Vol 19 (10) ◽  
pp. 103106 ◽  
Author(s):  
Vladimir Khudik ◽  
Igor Kaganovich ◽  
Gennady Shvets
2017 ◽  
Vol 35 (1) ◽  
pp. 120-125
Author(s):  
L. Liao ◽  
R. Zhao ◽  
Y. Bie ◽  
H. Zhang ◽  
C. Hu

AbstractThe Weibel instability of the collimated MeV fast electron beams in a nanotube array target is researched in this work. It is found that the filamentation of the fast electrons is significantly suppressed. When fast electrons propagate the nanotube array, a strong magnetic field is created near the surface of tubes to obstruct the transverse movement of the fast electrons and bend them into the inner vacuum spaces between the successive tubes. In consequence, the positive feedback loop between the magnetic field perturbation and the electrons density perturbation is broken and the Weibel instability is thus weakened. Furthermore, the calculated results by a hybrid particle-in-cell code have also proven this weakening effect on the Weibel instability. Because of the high-energy density delivered by the MeV electrons, these results indicate some significant applications in the high-energy physics, such as radiography, fast-electron beam focusing, and perhaps fast ignition.


2011 ◽  
Vol 18 (10) ◽  
pp. 103109 ◽  
Author(s):  
Carl Siemon ◽  
Vladimir Khudik ◽  
Gennady Shvets

Author(s):  
G. G. Shaw

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.


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