scholarly journals The absorption spectra of thin films of ternary compounds in the RbI–PbI2 system

2012 ◽  
Vol 38 (10) ◽  
pp. 943-947 ◽  
Author(s):  
O. N. Yunakova ◽  
V. K. Miloslavskii ◽  
E. N. Kovalenko ◽  
E. V. Ksenofontova
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Ternary Compounds

Exciton absorption spectra of thin films of RbCu2Cl3 and Rb2Cu3Cl5 ternary compounds

2021 ◽  
Vol 47 (5) ◽  
pp. 427-432
Author(s):  
E. N. Kovalenko ◽  
O. N. Yunakova ◽  
N. N. Yunakov
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Exciton Absorption ◽  
Ternary Compounds

CuxSbySz THIN FILMS PRODUCED BY ANNEALING CHEMICALLY DEPOSITED Sb2S3-CuS THIN FILMS

2001 ◽  
Vol 15 (17n19) ◽  
pp. 667-670 ◽  
Author(s):  
Y. RODRÍGUEZ-LAZCANO ◽  
M. T. S. NAIR ◽  
P. K. NAIR
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Optical Band Gap ◽  
Deposition Method ◽  
Photovoltaic Devices ◽  
Large Area ◽  
Electrical And Optical Properties ◽  
Ternary Compounds ◽  
Glass Substrates ◽  
Different Temperatures

The possibility of generating ternary compounds through annealing thin film stacks of binary composition has been demonstrated before. In this work we report a method to produce large area coating of ternary compounds through a reaction in solid state between thin films of Sb2S3 and CuS. Thin films of Sb2S3 -CuS were deposited on glass substrates in the sequence of Sb2S3 followed by CuS (on Sb2S3 ) using chemical bath deposition method. The multilayer stack, thus produced, of approximately 0.5 μm in thickness, where annealed under nitrogen and argon atmospheres at different temperatures to produce films of ternary composition, CuxSbySz . An optical band gap of ~1.5 eV was observed in these films, suggesting that the thin films of ternary composition formed in this way are suitable for use as absorber materials in photovoltaic devices. The results on the analyses of structural, electrical and optical properties of films formed with different combinations of thickness in the multilayers will be discussed in the paper.

Fine Structures of the X-Ray Absorption Spectra for Thin Films of Metallic Coppers

1970 ◽  
Vol 9 (11) ◽  
pp. 1372-1377
Author(s):  
Hayao Kubo ◽  
Hiroo Nakamori ◽  
Kenjiro Tsutsumi
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

Optical Absorption in Co-Deposited Mixed-Phase Hydrogenated Amorphous/Nanocrystalline Silicon Thin Films

2010 ◽  
Vol 1245 ◽  
Author(s):  
Lee Wienkes ◽  
Aaron Besaw ◽  
Curtis Anderson ◽  
David Bobela ◽  
Paul Stradins ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Spectra ◽  
Defect Density ◽  
Amorphous Material ◽  
Nanocrystalline Silicon ◽  
Esr Spectra ◽  
Hydrogenated Silicon ◽  
Silicon Thin Films ◽  
Electron Donation

AbstractThe conductivity of amorphous/nanocrystalline hydrogenated silicon thin films (a/nc-Si:H) deposited in a dual chamber co-deposition system exhibits a non-monotonic dependence on the nanocrystal concentration. Optical absorption measurements derived from the constant photocurrent method (CPM) and preliminary electron spin resonance (ESR) data for similarly prepared materials are reported. The optical absorption spectra, in particular the subgap absorption, are found to be independent of nanocrystalline density for relatively small crystal fractions (< 4%). For films with a higher crystalline content, the absorption spectra indicate broader Urbach slopes and higher midgap absorption. The ESR spectra show an approximately constant defect density across all of the films. These data are interpreted in terms of a model involving electron donation from the nanocrystals into the amorphous material.

Observation of the Berreman Effect in Infrared Reflection-Absorption Spectra of Amorphous Titanium Oxide Thin Films Deposited on Aluminum

2000 ◽  
Vol 54 (5) ◽  
pp. 687-691 ◽  
Author(s):  
B. C. Trasferetti ◽  
C. U. Davanzo ◽  
N. C. da Cruz ◽  
M. A. B. de Moraes
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Optical Constants ◽  
Polarized Light ◽  
Chemical Vapor ◽  
Layered System ◽  
Infrared Reflection ◽  
Fresnel Equation ◽  
Successful Technique

Infrared reflection-absorption spectra of plasma-enhanced chemical vapor deposition (PECVD) amorphous TiO2 thin films on aluminum were obtained with s- and p-polarized light and oblique incidence angles. Such spectra were analyzed by means of spectral simulations based on a Fresnel equation for a three-layered system. The optical constants used in the simulations were obtained through the Kramers–Krönig analysis of the reflectance spectra of a pellet of powdered amorphous TiO2. LO-TO energy-loss functions were also calculated from these optical constants, and a splitting was observed. A good qualitative agreement between experimental and simulated spectra was achieved, and the Berreman effect was observed in both cases when p-polarized light was used. It was shown, therefore, that the Berreman effect makes infrared reflection-absorption spectroscopy a successful technique for the characterization of an amorphous TiO2 thin layer on aluminum.

Absorption spectra of TiO2 thin films synthesized by the reactive radio-frequency magnetron sputtering of titanium

2014 ◽  
Vol 48 (7) ◽  
pp. 848-858 ◽  
Author(s):  
V. M. Ievlev ◽  
S. B. Kushchev ◽  
A. N. Latyshev ◽  
L. Yu. Leonova ◽  
O. V. Ovchinnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Radio Frequency ◽  
Absorption Spectra ◽  
Radio Frequency Magnetron ◽  
Radio Frequency Magnetron Sputtering ◽  
Tio2 Thin Films
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