scholarly journals Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy

2012 ◽  
Vol 112 (3) ◽  
pp. 034909 ◽  
Author(s):  
Maximilian Rumler ◽  
Mathias Rommel ◽  
Jürgen Erlekampf ◽  
Maral Azizi ◽  
Tobias Geiger ◽  
...  
2009 ◽  
Vol 1232 ◽  
Author(s):  
Raffaella Lo Nigro ◽  
Patrick Fiorenza ◽  
Vito Raineri

AbstractElectrical characterization of CaCu3Ti4O12 (CCTO) ceramics with scanning probe based techniques has been carried out. In particular, conductive atomic force microscopy (C-AFM) and scanning impedance microscopy (SIM) have been used to demonstrate the presence, shape and size in CCTO ceramics of the different electrically domains, both at the grain boundaries and within the grains. The electrical characteristics of single grains and of single domains have been evaluated and it has been observed that the conductive grains are surrounded by insulating grain boundaries.


2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  

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