scholarly journals Normal metal-superconductor decoupling as a source of thermal fluctuation noise in transition-edge sensors

2012 ◽  
Vol 112 (3) ◽  
pp. 034515 ◽  
Author(s):  
K. M. Kinnunen ◽  
M. R. J. Palosaari ◽  
I. J. Maasilta
Keyword(s):  
Thermal Fluctuation ◽  
Transition Edge Sensors ◽  
Normal Metal ◽  
Transition Edge ◽  
Fluctuation Noise

scholarly journals Thermal fluctuation noise in Mo/Au superconducting transition-edge sensor microcalorimeters

2019 ◽  
Vol 125 (16) ◽  
pp. 164503 ◽  
Author(s):  
N. A. Wakeham ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
S. Beaumont ◽  
J. A. Chervenak ◽  
...  
Keyword(s):  
Transition Edge Sensor ◽  
Thermal Fluctuation ◽  
Superconducting Transition ◽  
Transition Edge ◽  
Fluctuation Noise

Interfacial And Surface Study Of Mo-Au And Al-Ag Bilayers For Si-Based Photodetectors

1999 ◽  
Vol 5 (S2) ◽  
pp. 164-165
Author(s):  
Mary J. Li ◽  
S. Aslam ◽  
T.C. Chen ◽  
F.M. Finkbeiner ◽  
C. He ◽  
...  
Keyword(s):  
Transition Temperature ◽  
Quantum Interference ◽  
Ultra Violet ◽  
Incident Radiation ◽  
Transition Edge Sensors ◽  
Normal Metal ◽  
Superconducting Transition ◽  
Transition Edge ◽  
Superconductor Film ◽  
Superconducting Metal

Bilayer thin films have been utilized in superconducting transition-edge sensors (TES) for photodetector development. A TES is formed with a normal metal conductor film and a superconductor film, so called bilayer, deposited on a subtract. In its,transition temperature region, the resistance of the superconductor film is extremely sensitive to the temperature. When an incident radiation ray arrives, the temperature of the bilayer increases, leading the resistance increases tremendously. A superconducting quantum interference device measures the current variation for read-out. By varying the relative thickness of the normal metal conductor layer and the superconductor layer, one can adjust the transition temperature of the bilayer to a desired range according to the proximity effect. TES bilayers are fabricated on Si-based substrates for the development of infrared, ultra-violet, and x-ray detectors.Various normal and superconducting metal combinations are considered as bilayer candidates. When two metals are brought together, the concerns usually rise to those materials issues that may affect TES performance.

scholarly journals A two-dimensional resistor network model for transition-edge sensors with normal metal features

2019 ◽  
Vol 32 (8) ◽  
pp. 085010
Author(s):  
Daikang Yan ◽  
Lisa M Gades ◽  
Tejas Guruswamy ◽  
Antonino Miceli ◽  
Umeshkumar M Patel ◽  
...  
Keyword(s):  
Network Model ◽  
Transition Edge Sensors ◽  
Normal Metal ◽  
Two Dimensional ◽  
Resistor Network ◽  
Transition Edge

Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer

2000 ◽  
Vol 77 (26) ◽  
pp. 4422-4424 ◽  
Author(s):  
H. F. C. Hoevers ◽  
A. C. Bento ◽  
M. P. Bruijn ◽  
L. Gottardi ◽  
M. A. N. Korevaar ◽  
...  
Keyword(s):  
Thermal Fluctuation ◽  
Superconducting Transition ◽  
Transition Edge ◽  
Fluctuation Noise

scholarly journals Effects of Normal Metal Features on Superconducting Transition-Edge Sensors

2018 ◽  
Vol 193 (3-4) ◽  
pp. 231-240 ◽  
Author(s):  
N. A. Wakeham ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
J. A. Chervenak ◽  
A. M. Datesman ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Normal Metal ◽  
Superconducting Transition ◽  
Transition Edge

Characterization and reduction of noise in Mo/Au transition edge sensors

2004 ◽  
Vol 520 (1-3) ◽  
pp. 348-350 ◽  
Author(s):  
Mark A. Lindeman ◽  
Simon Bandler ◽  
Regis P. Brekosky ◽  
James A. Chervenak ◽  
Enectali Figueroa-Feliciano ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Transition Edge

A Study of the Excess Noise of Ir Transition Edge Sensors in the Frame of Statistical Models

2009 ◽  
Vol 19 (3) ◽  
pp. 445-450 ◽  
Author(s):  
D. Bagliani ◽  
D.F. Bogorin ◽  
E. Celasco ◽  
M. Celasco ◽  
R. Eggenhoffner ◽  
...  
Keyword(s):  
Statistical Models ◽  
Transition Edge Sensors ◽  
Excess Noise ◽  
Transition Edge

scholarly journals Characterizing the optical response of ultra-low-noise far-infrared 60–110 μm transition edge sensors

2020 ◽  
Vol 91 (12) ◽  
pp. 123104
Author(s):  
E. A. Williams ◽  
S. Withington ◽  
D. J. Goldie ◽  
C. N. Thomas ◽  
P. A. R. Ade ◽  
...  
Keyword(s):  
Far Infrared ◽  
Optical Response ◽  
Transition Edge Sensors ◽  
Low Noise ◽  
Transition Edge ◽  
Ultra Low Noise
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