An improved carrier rate model to evaluate internal quantum efficiency and analyze efficiency droop origin of InGaN based light-emitting diodes
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2012 ◽
Vol 2012
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pp. 1-5
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2014 ◽
Vol 50
(11)
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pp. 911-920
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2010 ◽
Vol 22
(6)
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pp. 374-376
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2016 ◽
Vol 8
(41)
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pp. 27911-27919
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