Nonlinear relativistic single-electron Thomson scattering power spectrum for incoming laser of arbitrary intensity

2012 ◽  
Vol 19 (6) ◽  
pp. 062302 ◽  
Author(s):  
R. F. Álvarez-Estrada ◽  
I. Pastor ◽  
J. Guasp ◽  
F. Castejón
Keyword(s):  
Power Spectrum ◽  
Thomson Scattering ◽  
Single Electron ◽  
Arbitrary Intensity ◽  
Incoming Laser

scholarly journals Inverse Compton Scattering in Strong Magnetic Fields: Applied to the Radiation Mechanism of PSR 0531+21

1987 ◽  
Vol 125 ◽  
pp. 453-453
Author(s):  
H. Chen ◽  
X.J. Wu ◽  
G.J. Qiao
Keyword(s):  
Magnetic Fields ◽  
Power Spectrum ◽  
Compton Scattering ◽  
Cross Section ◽  
Quantum Effect ◽  
Single Electron ◽  
Radiation Mechanism ◽  
Strong Magnetic Fields ◽  
Inverse Compton Scattering ◽  
Inverse Compton

In strong magnetic field near pulsar's surface, the quantum effect for electrons is quite complicated. The classical approximation may lose resonance feature, which gives much smaller cross-section.In this paper, we performed numerical integrations to get the total cross-section and the power spectrum of single electron. Thus considering the resonance, the inverse Compton scattering could be an efficient mechanism in strong magnetic fields. We have carefully calculated the power spectrum of single electron travelling through the isotropic thermal fields.

Evaluation of single-electron movies of glutamine synthetase molecules

1983 ◽  
Vol 41 ◽  
pp. 280-281
Author(s):  
W. Kunath ◽  
E. Zeitler ◽  
M. Kessel
Keyword(s):  
Electron Microscope ◽  
Glutamine Synthetase ◽  
Electron Irradiation ◽  
Structural Damage ◽  
Structural Changes ◽  
Single Electron ◽  
Continuous Series ◽  
Digital Recording ◽  
Recording Device ◽  
Low Exposure

The features of digital recording of a continuous series (movie) of singleelectron TV frames are reported. The technique is used to investigate structural changes in negatively stained glutamine synthetase molecules (GS) during electron irradiation and, as an ultimate goal, to look for the molecules' “undamaged” structure, say, after a 1 e/Å2 dose.The TV frame of fig. la shows an image of 5 glutamine synthetase molecules exposed to 1/150 e/Å2. Every single electron is recorded as a unit signal in a 256 ×256 field. The extremely low exposure of a single TV frame as dictated by the single-electron recording device including the electron microscope requires accumulation of 150 TV frames into one frame (fig. lb) thus achieving a reasonable compromise between the conflicting aspects of exposure time per frame of 3 sec. vs. object drift of less than 1 Å, and exposure per frame of 1 e/Å2 vs. rate of structural damage.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Log-log scale roughness spectroscopy of surfaces

1993 ◽  
Vol 51 ◽  
pp. 224-225
Author(s):  
P. Fraundorf ◽  
B. Armbruster
Keyword(s):  
Power Spectrum ◽  
Autocorrelation Function ◽  
Power Spectra ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Lateral Structure ◽  
Scale Roughness

Optical interferometry, confocal light microscopy, stereopair scanning electron microscopy, scanning tunneling microscopy, and scanning force microscopy, can produce topographic images of surfaces on size scales reaching from centimeters to Angstroms. Second moment (height variance) statistics of surface topography can be very helpful in quantifying “visually suggested” differences from one surface to the next. The two most common methods for displaying this information are the Fourier power spectrum and its direct space transform, the autocorrelation function or interferogram. Unfortunately, for a surface exhibiting lateral structure over several orders of magnitude in size, both the power spectrum and the autocorrelation function will find most of the information they contain pressed into the plot’s origin. This suggests that we plot power in units of LOG(frequency)≡-LOG(period), but rather than add this logarithmic constraint as another element of abstraction to the analysis of power spectra, we further recommend a shift in paradigm.

Single-electron sensitivity with a lens-coupled CCD camera

1993 ◽  
Vol 51 ◽  
pp. 642-643
Author(s):  
G.Y. Fan ◽  
Bruce Mrosko ◽  
Mark H. Ellisman
Keyword(s):  
Focal Length ◽  
Thick Layer ◽  
Ccd Camera ◽  
Single Electron ◽  
Bottom Flange ◽  
X Rays ◽  
Red Phosphor ◽  
Ccd Detector ◽  
Lens Assembly ◽  
Efficient Coupling

A lens coupled CCD camera showing single electron sensitivity has been built for TEM applications. The design is illustrated in Fig. 1. The bottom flange of a JEM-4000EX microscope is replaced by a special flange which carries a large rectangular leaded glass window, 22 mm thick. A 20 μm thick layer of red phosphor is coated on the window, and the entire window is sputter-coated with a thin layer of Au/Pt. A two-lens relay system is used to provide efficient coupling between the image on the phosphor scintillator and the CCD imager. An f1.0 lens (Goerz optical) with front focal length 71.6 mm is used as the collector. A mirror prism, of the Amici type, is used to "bend" the optical path by 90° to prevent X-rays which may penetrate the leaded glass from hitting the CCD detector. Images may be relayed directly to the camera (1:1) or demagnified by a factor of up to 3:1 by moving the lens assembly.

THOMSON SCATTERING WITH A HIGH BACKGROUND LEVEL OF PLASMA RADIATION

1979 ◽  
Vol 40 (C7) ◽  
pp. C7-851-C7-852
Author(s):  
B. Van der Sijde ◽  
T. Poorter ◽  
S. Adema ◽  
B. F.M. Pots ◽  
D. C. Schram
Keyword(s):  
Background Level ◽  
Thomson Scattering ◽  
Plasma Radiation ◽  
High Background

INSTABILITIES IN THE POWER SPECTRUM OF MODE-LOCKED SEMICONDUCTOR LASERS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-405-C2-408 ◽  
Author(s):  
D. BAUMS ◽  
M. SERÉNYI ◽  
W. ELSÄSSER ◽  
E. O. GÖBEL
Keyword(s):  
Power Spectrum ◽  
Semiconductor Lasers
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