A multiple angle material parameter extraction method for stacked layers of dielectrics using thz time domain spectroscopy
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2018 ◽
Vol 39
(4)
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pp. 349-366
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2010 ◽
Vol 28
(11)
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pp. 1685-1692
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2014 ◽
Vol 50
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pp. 433-436
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2014 ◽
Vol 29
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pp. 558-566
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