Orientation and electronic structure of methylene blue on mica: A near edge x‐ray absorption fine structure spectroscopy study

1996 ◽  
Vol 104 (19) ◽  
pp. 7749-7757 ◽  
Author(s):  
G. Hähner ◽  
A. Marti ◽  
N. D. Spencer ◽  
W. R. Caseri
Keyword(s):  
Methylene Blue ◽  
Electronic Structure ◽  
Fine Structure ◽  
Spectroscopy Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Local electronic structure analysis of Zn-doped BiFeO3 powders by X-ray absorption fine structure spectroscopy

2017 ◽  
Vol 710 ◽  
pp. 843-849 ◽  
Author(s):  
Turghunjan Gholam ◽  
Abduleziz Ablat ◽  
Mamatrishat Mamat ◽  
Rong Wu ◽  
Aimierding Aimidula ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Local Electronic Structure ◽  
X Ray Absorption

Near-Edge X-ray Absorption Fine Structure Spectroscopy Study of the Photolytic Process in Poly(phenyl thioether) with Pendant Iron Moieties

2008 ◽  
Vol 41 (24) ◽  
pp. 9532-9541 ◽  
Author(s):  
Edwige Otero ◽  
Patrick O. Shipman ◽  
Alaa S. Abd-El-Aziz ◽  
Stephen G. Urquhart
Keyword(s):  
Fine Structure ◽  
Spectroscopy Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Extended x-ray-absorption fine-structure spectroscopy study of glassyFe79Si11B10

1988 ◽  
Vol 38 (8) ◽  
pp. 5740-5743 ◽  
Author(s):  
Y. Zheng ◽  
R. H. Duan ◽  
Z. Y. Hua
Keyword(s):  
Fine Structure ◽  
Spectroscopy Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-Ray Absorption Fine Structure Spectroscopy Study of Arsenate Adsorption on Schwertmannite

2007 ◽  
Author(s):  
Masako Sakamaki ◽  
Hirokazu Takahashi ◽  
Takehisa Konishi ◽  
Atsuyuki Inoue ◽  
Takashi Fujikawa
Keyword(s):  
Fine Structure ◽  
Spectroscopy Study ◽  
X Ray ◽  
Absorption Fine ◽  
Arsenate Adsorption ◽  
X Ray Absorption

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

Chromium oxide as a metal diffusion barrier layer: An x-ray absorption fine structure spectroscopy study

2014 ◽  
Vol 115 (4) ◽  
pp. 044315 ◽  
Author(s):  
Md. Ahamad Mohiddon ◽  
K. Lakshun Naidu ◽  
M. Ghanashyam Krishna ◽  
G. Dalba ◽  
S. I. Ahmed ◽  
...  
Keyword(s):  
Fine Structure ◽  
Chromium Oxide ◽  
Barrier Layer ◽  
Diffusion Barrier ◽  
Spectroscopy Study ◽  
X Ray ◽  
Absorption Fine ◽  
Metal Diffusion ◽  
Diffusion Barrier Layer ◽  
X Ray Absorption
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