scholarly journals Characterization of the minimum energy path for the reaction of singlet methylene with N2: The role of singlet methylene in prompt NO

1995 ◽  
Vol 103 (12) ◽  
pp. 4930-4936 ◽  
Author(s):  
Stephen P. Walch
Keyword(s):  
Minimum Energy ◽  
Minimum Energy Path ◽  
Singlet Methylene

Theoretical characterization of the minimum energy path for the reaction H+O2→HO2*→HO+O

1988 ◽  
Vol 88 (10) ◽  
pp. 6273-6281 ◽  
Author(s):  
Stephen P. Walch ◽  
Celeste McMichael Rohlfing ◽  
Carl F. Melius ◽  
Charles W. Bauschlicher
Keyword(s):  
Minimum Energy ◽  
Minimum Energy Path ◽  
Theoretical Characterization

Erratum: Theoretical characterization of the minimum energy path for the reaction H+O2→HO2*→HO+O [J. Chem. Phys. 88, 6273 (1988)]

1989 ◽  
Vol 90 (12) ◽  
pp. 7613-7613 ◽  
Author(s):  
Stephen P. Walch ◽  
Celeste McMichael Rohlfing ◽  
Carl F. Melius ◽  
Charles W. Bauschlicher
Keyword(s):  
Minimum Energy ◽  
Chem Phys ◽  
Minimum Energy Path ◽  
Theoretical Characterization

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

Consideraciones en torno a la reducción solipsista

1970 ◽  
Vol 11 ◽  
Author(s):  
Natalia Carolina Petrillo

ResumenEn el presente trabajo se intentará mostrar que la fenomenología no conduce a una postura solipsista. Para ello, se caracterizará en qué consiste el solipsismo. Luego, se intentará refutar a lo que se ha de llamar “solipsismo metafísico” y “solipsismo gnoseológico”, con el objetivo principal de poner de manifiesto el fundamento de motivación para la salida de la ficción solipsista.Palabras claves:Phenomenology – solipsim – empatía - HusserlAbstractWith the aim of showing that phenomenology does not lead in solipsism, I will first attempt a characterization of it. Then, I will attempt a refutation of the so-called “metaphysical” and “epistemological” solipsisms. Finally, the nature and role of Husserl´s solipsistic fiction is examined, and the grounds that motivate the overcoming of this standpoint are disclosed.key wordsFenomenología – solipsismo - empathy – Husserl

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