The dissociation kinetics of NO on Rh(111) as studied by temperature programmed static secondary ion mass spectrometry and desorption

1994 ◽  
Vol 101 (11) ◽  
pp. 10052-10063 ◽  
Author(s):  
H. J. Borg ◽  
J. F. C.‐J. M. Reijerse ◽  
R. A. van Santen ◽  
J. W. Niemantsverdriet
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Dissociation Kinetics ◽  
Ion Mass Spectrometry ◽  
Temperature Programmed ◽  
Kinetics Of ◽  
Secondary Ion

Potassium Adsorption on Pt(111) and its Effect on Co Chemisorption

1986 ◽  
Vol 83 ◽  
Author(s):  
C. Michael Greenlief ◽  
Patricia L. Radloff ◽  
Sohail Akhter ◽  
J. M. White
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Cluster Ions ◽  
Function Change ◽  
Temperature State ◽  
Work Function Change ◽  
Ion Mass Spectrometry ◽  
Temperature Programmed ◽  
Lower Temperature ◽  
Secondary Ion

ABSTRACTTemperature programmed desorption (TPD) and secondary ion mass spectrometry (SIMS) have been used to study the chemisorption properties of carbon monoxide on potassium predosed Pt. SIMS cluster ions (such as K+, K2+, KO+ and KCO+) were monitored to probe, K-CO interactions. Large changes in the SIMS yields are observed as the potassium coverage is varied. The SIMS results are correlated with previous work function change and TPD studies. Temperature programmed secondary ion mass spectrometry of potassium-containing ions indicates a local interaction between potassium and CO molecules.As typically observed on transition metal surfaces, two different CO TPD states are observed. The lower temperature state shifts to higher temperatures with increasing potassium coverage and to lower temperatures with increasing CO exposure. The high temperature CO state builds in with increasing potassium coverage and is accompanied by simultaneous potassium desorption. Evidence for the occurrence of both long-range (indirect) and short-range (direct) potassium effects on adsorbed CO is presented.

Degradation Kinetics of VX on Concrete by Secondary Ion Mass Spectrometry

Langmuir ◽  
2005 ◽  
Vol 21 (6) ◽  
pp. 2386-2390 ◽  
Author(s):  
John M. Williams ◽  
Brad Rowland ◽  
Mark T. Jeffery ◽  
Gary S. Groenewold ◽  
Anthony D. Appelhans ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Degradation Kinetics ◽  
Ion Mass Spectrometry ◽  
Kinetics Of ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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