Gas‐phase x‐ray photoelectron spectroscopy of model molecules relating to the thermochromism in poly(3‐alkylthiophene)

1990 ◽  
Vol 93 (9) ◽  
pp. 6357-6362 ◽  
Author(s):  
M. P. Keane ◽  
S. Svensson ◽  
A. Naves de Brito ◽  
N. Correia ◽  
S. Lunell ◽  
...  
Keyword(s):  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
X Ray

X-Ray photoelectron spectroscopy of monosubstituted perfluorobenzenes

1977 ◽  
Vol 55 (8) ◽  
pp. 1279-1284 ◽  
Author(s):  
Barry C. Trudell ◽  
S. James W. Price
Keyword(s):  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
Binding Energies ◽  
Photoelectron Spectra ◽  
Atomic Charges ◽  
X Ray ◽  
Sophisticated Analysis ◽  
Charge Calculations

The gas phase X-ray photoelectron spectra, XPS, were observed for the series C6F5X (X = F, Cl, I, Br, H). Binding energies were determined from the spectra using the ESCAPLOT Program. Charge calculations were carried out using Equalization of Electronegativity, CNDO/2, and ACHARGE approaches on each molecule. The more sophisticated analysis leads to the following equation correlating the (C 1s) binding energies and the atomic charges qi[Formula: see text]

The application of gas phase and solid state X-ray photoelectron spectroscopy to the investigation of derivatives containing the repeating SN unit

1980 ◽  
Vol 1 (2) ◽  
pp. 161-173 ◽  
Author(s):  
Patrick Brant ◽  
David C. Weber ◽  
Curtis T. Ewing ◽  
Forrest L. Carter ◽  
Joseph A. Hashmall
Keyword(s):  
Solid State ◽  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
X Ray

scholarly journals Photoactivity of Titanium Dioxide Foams

2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
Maryam Jami ◽  
Ralf Dillert ◽  
Yanpeng Suo ◽  
Detlef W. Bahnemann ◽  
Michael Wark
Keyword(s):  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
Colloidal Suspensions ◽  
Air Purification ◽  
Semiconductor Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Mechanical Stirring ◽  
Amphiphilic Molecules ◽  
Oxidation Of No

TiO2 foams have been prepared by a simple mechanical stirring method. Short-chain amphiphilic molecules have been used to stabilize colloidal suspensions of TiO2 nanoparticles. TiO2 foams were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), UV-vis absorption spectroscopy, and scanning electron microscopy (SEM). The photoassisted oxidation of NO in the gas phase according to ISO 22197-1 has been used to compare the photoactivity of the newly prepared TiO2 foams to that of the original powders. The results showed that the photoactivity is increased up to about 135%. Foam structures seem to be a good means of improving the photoactivity of semiconductor materials and can readily be used for applications such as air purification devices.

Nanostructured TiO2 modified by perfluoropolyethers: Gas phase photocatalytic activity

2010 ◽  
Vol 25 (1) ◽  
pp. 96-103 ◽  
Author(s):  
Claudia L. Bianchi ◽  
Silvia Ardizzone ◽  
Giuseppe Cappelletti ◽  
Giuseppina Cerrato ◽  
Walter Navarrini ◽  
...  
Keyword(s):  
Gas Phase ◽  
Surface Area ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
High Surface ◽  
Ammonium Phosphate ◽  
Water Contact ◽  
Electronic Band ◽  
X Ray ◽  
Bet Analysis

A high-molecular-weight perfluoropolyether (PFPE-YR) and a perfluoropolyether containing ammonium phosphate (PFPE-F10) have been evaluated as fluorinated coating for high-surface-area titanium oxides. Coated nano-TiO2 shows hydrophobic properties and excellent buoyancy on water. In addition to photoactivity toward the degradation of toluene in gas phase, specific trial analyses have been completed to estimate the modified titanium oxide features. Brunauer–Emmett–Teller (BET) analysis for the surface area determination, ultraviolet-visible spectroscopy (UV-Vis) for the material electronic band gap, high-resolution transmission electron microscopy (HRTEM), x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS) for the morphology, structure, and surface composition, respectively, and water contact angle and infrared (IR) analysis have been performed to estimate the wettability and stability of coated titanium.

Kinetics of the gas-phase halogenation of a polyethylene surface as studied with x-ray photoelectron spectroscopy

1990 ◽  
Vol 23 (17) ◽  
pp. 3922-3928 ◽  
Author(s):  
James F. Elman ◽  
Louis J. Gerenser ◽  
Kim E. Goppert-Berarducci ◽  
John M. Pochan
Keyword(s):  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Kinetics Of ◽  
Polyethylene Surface

Early Nucleation of Diamond in a Combustion Flame

1992 ◽  
Vol 270 ◽  
Author(s):  
Michael T. McClure ◽  
Jesko A. von Windheim ◽  
Jeffrey T. Glass ◽  
John T. Prater
Keyword(s):  
Gas Phase ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Flame Structure ◽  
Low Oxygen ◽  
Si Substrate ◽  
Diamond Nucleation ◽  
X Ray ◽  
Diamond Crystals ◽  
Deposition Area

ABSTRACTThe early stages of a gas phase pretreatment for diamond nucleation in an oxy-acetylene flame were investigated. The pretreatment involved a low oxygen-to-acetylene ratio (Rf = 0.93) performed at 15 mm from the torch on a scratched Si substrate. The nature of the carbon species deposited was analyzed using X-ray photoelectron spectroscopy, Auger electron spectroscopy, and scanning electron microscopy. The pretreatment process produced diamond crystals after 30 seconds and a complete film in the center of the deposition area after 180 seconds. Furthermore, the pretreatment process kept the initial Siob2 layer less than the thickness generated by the control conditions, (Rf = 0.97, d = 10mm). The success of the pretreatment was attributed to changes in the flame structure and chemistry from the control conditions.

scholarly journals Effect of X-ray spot size on liquid jet photoelectron spectroscopy

2015 ◽  
Vol 22 (6) ◽  
pp. 1528-1530 ◽  
Author(s):  
Giorgia Olivieri ◽  
Alok Goel ◽  
Armin Kleibert ◽  
Matthew A. Brown
Keyword(s):  
Gas Phase ◽  
Light Source ◽  
Photoelectron Spectroscopy ◽  
Spot Size ◽  
Substantial Decrease ◽  
Liquid Jet ◽  
Exit Slit ◽  
X Ray ◽  
Swiss Light Source

A 30 µm pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 µm pinhole reduces the beam dimensions from 250 (v) × 100 (h) µm to 75 × 45 µm for a vertical exit slit of 100 µm. The smaller X-ray spot results in a substantial decrease in the gas-phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments.

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