Photoelectron spectroscopy of the negative cluster ions NO−(N2O)n=1,2

1987 ◽  
Vol 87 (8) ◽  
pp. 4302-4309 ◽  
Author(s):  
J. V. Coe ◽  
J. T. Snodgrass ◽  
C. B. Freidhoff ◽  
K. M. McHugh ◽  
K. H. Bowen
Keyword(s):  
Photoelectron Spectroscopy ◽  
Cluster Ions

Photoelectron spectroscopy of size-selected cluster ions using synchrotron radiation

2014 ◽  
Vol 115 (3) ◽  
pp. 771-779 ◽  
Author(s):  
Thomas Schramm ◽  
Gerd Ganteför ◽  
Andras Bodi ◽  
Partick Hemberger ◽  
Thomas Gerber ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
Cluster Ions

scholarly journals Photoelectron Spectroscopy of Mass-Selected Copper-Water Cluster Negative Ions

1995 ◽  
Vol 15 (2-4) ◽  
pp. 195-207 ◽  
Author(s):  
Fuminori Misaizu ◽  
Keizo Tsukamato ◽  
Masaomi Sanekata ◽  
Kiyokazu Fuke
Keyword(s):  
Photoelectron Spectroscopy ◽  
Negative Ions ◽  
Photoelectron Spectra ◽  
Negative Ion ◽  
Cluster Ions ◽  
Electron Detachment ◽  
Energy Bands ◽  
Size Dependent ◽  
Spectral Shifts ◽  
Metal Atoms

Negative-ion photoelectron spectroscopy has been applied in order to obtain size dependent information about the electronic structure of clusters of metal atoms solvated with polar molecules. In the present paper we have investigated the photoelectron spectra of Cu2-(H2O)n, cluster ions with 2 = 0–4 and also those of Cu2-(H2O)n, with n = 0 and 1. In the spectra of Cu2-(H2O)n, the lowest energy bands were assigned to the electron detachment from the CuOH-(H2O)n−1, which were produced in the source together with the above cluster ions. The observed bands for Cu2-(H2O)n were all assigned to the transitions to the states originating in the ground 2S and first excited 2D states of the Cu atom. The stepwise hydration for Cu- and Cu2- was discussed from the observed spectral shifts.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

1990 ◽  
Vol 48 (2) ◽  
pp. 388-389
Author(s):  
A. M. Bradshaw
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Reactivity ◽  
Target Material ◽  
Orbital Energy ◽  
Light Sources ◽  
Analytical Technique ◽  
Hartree Fock ◽  
Spatially Resolved ◽  
Koopmans Theorem ◽  
Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Two dimensional Sr silicate grown on Si(001) studied using X-ray Photoelectron Spectroscopy

2006 ◽  
Vol 132 ◽  
pp. 87-90
Author(s):  
M. El Kazzi ◽  
G. Delhaye ◽  
S. Gaillard ◽  
E. Bergignat ◽  
G. Hollinger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Two Dimensional ◽  
X Ray
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