Resonance ionization photoelectron spectroscopy of lanthanide elements

1986 ◽  
Vol 85 (9) ◽  
pp. 4794-4801 ◽  
Author(s):  
D. L. Donohue ◽  
J. P. Young ◽  
D. H. Smith
Keyword(s):  
Photoelectron Spectroscopy ◽  
Resonance Ionization ◽  
Lanthanide Elements

A 9 eV superexcited state of 1,3-cyclohexadiene revealed by double resonance ionization photoelectron spectroscopy

2001 ◽  
Vol 349 (5-6) ◽  
pp. 405-410 ◽  
Author(s):  
Wei Cheng ◽  
Conor L. Evans ◽  
Narayanan Kuthirummal ◽  
Peter M. Weber
Keyword(s):  
Photoelectron Spectroscopy ◽  
Double Resonance ◽  
Resonance Ionization

scholarly journals Electrodeposition and Characterization of Lanthanide Elements on Carbon Sheets

Coatings ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 100
Author(s):  
Min Hee Joo ◽  
So Jeong Park ◽  
Sung-Min Hong ◽  
Choong Kyun Rhee ◽  
Dongsoo Kim ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Full Data ◽  
Data Set ◽  
X Ray ◽  
Thin Film Fabrication ◽  
Lanthanide Elements ◽  
Fundamental Information ◽  
Electrochemical Coating ◽  
Carbon Sheet

Electrochemical coating and recovery by electrodeposition have been invaluably employed for facial thin film fabrication and the recycling of used materials. Herein, we have established a full data set of lanthanide (Ln: La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, and Yb) elements electrodeposited on carbon sheets. Cyclic voltammetry was performed for 10 mM Ln(III) ions in a 0.1 M NaClO4 electrolyte over a carbon sheet between +0.5 V and −1.7 V (vs. Ag/AgCl). Amperometry was performed at a given potential to electrodeposit the Ln element on the carbon sheet. Their physicochemical properties were fully investigated by scanning electron microscopy, Fourier-transform infrared spectroscopy, energy-dispersive X-ray spectroscopy, and X-ray photoelectron spectroscopy. The newly established full data set for Ln(III) ions over carbon electrodes provides useful fundamental information for the development of coating and recovery methods of Ln elements.

scholarly journals [La(ηx-Bx)La]− (x = 7–9): a new class of inverse sandwich complexes

2019 ◽  
Vol 10 (8) ◽  
pp. 2534-2542 ◽  
Author(s):  
Teng-Teng Chen ◽  
Wan-Lu Li ◽  
Jun Li ◽  
Lai-Sheng Wang
Keyword(s):  
Computational Chemistry ◽  
Photoelectron Spectroscopy ◽  
Sandwich Complexes ◽  
New Class ◽  
Lanthanide Elements

Photoelectron spectroscopy and computational chemistry reveal that lanthanide elements can form a class of novel inverse sandwich complexes consisting of aromatic B7, B8, and B9 monocyclic rings.

Electron spectroscopy of surfaces by de-excitation of metastable noble gas atoms

1986 ◽  
Vol 318 (1541) ◽  
pp. 51-58 ◽  
Keyword(s):  
Ground State ◽  
Photoelectron Spectroscopy ◽  
Noble Gas ◽  
State Level ◽  
Atomic Layer ◽  
Resonance Ionization ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
Penning Ionization ◽  
Electronically Excited ◽  
Ground State Level

Electronically excited, metastable noble gas atoms A* (for example H e*21S, excitation energy E* — 20.6 eV) with thermal kinetic energy are very efficiently quenched upon collision with a surface S, i.e. A* + S -> A + S+ + e~. De-excitation proceeds through two competing mechanisms: (i) Auger de-excitation (equivalent to Penning ionization), or (ii) resonance ionization followed by Auger neutralization. The energy distribution of the emitted electrons is governed by the overlap between the wavefunctions of the target and the unoccupied (ground-state) level of the impinging atoms. As a consequence, this technique is extremely sensitive to the density of valence electronic states of the outermost atomic layer. Results for clean and adsorbate-covered surfaces are presented in comparison with data recorded by ultraviolet photoelectron spectroscopy, to demonstrate the capabilities of this method.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

1990 ◽  
Vol 48 (2) ◽  
pp. 388-389
Author(s):  
A. M. Bradshaw
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Reactivity ◽  
Target Material ◽  
Orbital Energy ◽  
Light Sources ◽  
Analytical Technique ◽  
Hartree Fock ◽  
Spatially Resolved ◽  
Koopmans Theorem ◽  
Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Two dimensional Sr silicate grown on Si(001) studied using X-ray Photoelectron Spectroscopy

2006 ◽  
Vol 132 ◽  
pp. 87-90
Author(s):  
M. El Kazzi ◽  
G. Delhaye ◽  
S. Gaillard ◽  
E. Bergignat ◽  
G. Hollinger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Two Dimensional ◽  
X Ray
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